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Relevant Instrument(s)

B16 Test Beamline

This is a flexible and versatile beamline for testing new developments in optics and detector technology and for trialling new experimental techniques. The beamline provides both white and monochromatic X-rays in several operational modes.

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Energy: 4 - 45 keV
Imaging X-ray Diffraction Microscopy Topography XRR: X-ray Reflectivity

I07 Surface and Interface Diffraction

I07 is a high-resolution X-ray diffraction beamline for investigating the structure of surfaces and interfaces under different environmental conditions, including, for example, semiconductors and biological films.

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Wavelength: 0.4 - 2.0 Å
Energy: 6 - 30 keV
X-ray Diffraction XRR: X-ray Reflectivity Spectroscopy GIXD: Grazing Incidence X-ray Diffraction SXRD: Surface X-ray Diffraction GISAXS: Grazing Incidence SAXS GIWAXS: Grazing Incidence WAXS SAXS: Small Angle X-ray Scattering Surface X-ray Diffraction Scattering

K11 DIAD: Dual Imaging and Diffraction

DIAD will be the a dual beam instrument capable of imaging and diffraction at the same time at the micron scale. The beamline will enable in-situ experiments aiming to resolve the 3D microstructure (via imaging) and phase constitution/strain state of material (via diffraction) in quasi-simultaneously matter with switching times of a few Hz between analysis techniques.

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Beamsize: Imaging beam: up to 1.7x1.7mm; Diffraction beam: ~ 10 µm
Detector: PCO.edge or equivalent, Pilatus Dectris 2M CdTe
Energy: 7-38 keV
Imaging In situ X-ray Diffraction Microfocus PCI: Phase Contrast Imaging Tomography

I14 Hard X-ray Nanoprobe

The Hard X-ray nanoprobe I14 beamline is a dedicated facility for nanoscale microscopy. The central theme of the beamline is the ability to obtain structural and chemically-specific information on a full range of materials (inorganic/organic) under both static and real (e.g. wet, heated, in-situ strain) conditions.

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Energy: 5 - 20 keV
XAS: X-ray Absorption Spectroscopy XRF: X-ray Fluorescence Imaging X-ray Diffraction nXRD: nano X-ray Diffraction Ptychography Spectroscopy PCI: Phase Contrast Imaging Tomography Microscopy SAXS: Small Angle X-ray Scattering nSpectroscopy: nano Spectroscopy XANES: X-ray Absorption Near Edge Structure EXAFS: Extended X-ray Absorption Fine Structure

I12 JEEP: Joint Engineering, Environment and Processing

I12 is a high-energy beamline principally for Material Science, Engineering and Processing Science. The instrument’s main focus is to allow in situ studies of samples in environments as close as possible to real world environments using imaging, tomography, diffraction and small-angle scattering. I12 is particularly well suited to study large or dense objects and offers a unique sample and environment installation facility for weights up to 2000 kg.

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Beamsize: From 50 micrometer x 50 micrometer to 50 mm x 15 mm (EH1) or 100 mm x 30 mm (EH2)
Energy: 53 – 150 keV
EDD: Energy Dispersive Diffraction Imaging SAXS: Small Angle X-ray Scattering X-ray Diffraction PCI: Phase Contrast Imaging Tomography X-ray Powder Diffraction Scattering High Pressure

I18 Microfocus Spectroscopy

µX-ray absorption spectroscopy, µX-ray fluorescence imaging and µdiffraction using high-brightness focused X-ray beam. Other techniques available include X-ray Excited Optical Luminescence (XEOL), X-ray Fluorescence Tomography, Fluorescence ReflEXAFS, Differential Phase Contrast Imaging.

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Beamsize: 2 µm x 2.5 µm
Energy: 2.05 - 20.5 keV
XANES: X-ray Absorption Near Edge Structure XAS: X-ray Absorption Spectroscopy X-ray Diffraction XRF: X-ray Fluorescence In situ Microfocus Spectroscopy X-ray Powder Diffraction microXRD microXANES microXAS High Pressure EXAFS: Extended X-ray Absorption Fine Structure Imaging

B18 Core XAS

B18 is a general purpose EXAFS beamline. The Core-EXAFS is used for an extensive range of studies and applications, including local structure and electronic state of active components, and the study of materials including fluids, crystalline and non-crystalline (amorphous phases & colloids) solids, surfaces and biomaterials.

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Beamsize: 200 µm x 250 µm
Energy: 2.05 - 35 keV
EXAFS: Extended X-ray Absorption Fine Structure XRF: X-ray Fluorescence X-ray Diffraction XAS: X-ray Absorption Spectroscopy XANES: X-ray Absorption Near Edge Structure In situ Imaging NEXAFS: Near Edge X-ray Absorption Fine Structures Spectroscopy X-ray Powder Diffraction

I16 Materials and Magnetism

The Materials and Magnetism beamline provides a unique, world-class single crystal X-ray diffraction facility for studying a diverse range of materials.

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Energy: 2.7 - 15 keV
Imaging Spectroscopy X-ray Diffraction WAXS: Wide Angle X-ray Scattering X-ray Single Crystal Diffraction High Pressure Scattering Bragg CDI CDI: Coherent Diffraction Imaging Ptychography GIWAXS: Grazing Incidence WAXS SXRD: Surface X-ray Diffraction Spectroscopy XMLD: X-Ray Magnetic Linear Dichroism XMCD: X-ray Magnetic Circular Dichroism XRR: X-ray Reflectivity REXS: Resonant Elastic X-ray Scattering

I11 High Resolution Powder Diffraction

I11 is a high resolution powder diffraction beamline for structural crystallography using an undulator source. This beamline specialises in investigating the structure of complex materials, including metal-organic frameworks, high temperature superconductors, ceramics, alloys, zeolites and minerals under non-ambient, time-resolved, and long duration conditions.

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Wavelength: 0.5-2.1 Å
Energy: 6-25 (30*) keV - optimised at 15 keV
In situ X-ray Diffraction Gas Environments X-ray Powder Diffraction Humidity Control

I15 Extreme Conditions

I15, the extreme conditions beamline, is a high energy diffraction and scattering beamline used to explore planetary interior conditions, as well as other experiments requiring high pressures and non-ambient temperatures.

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Wavelength: 0.620-0.155 Å
Energy: 20-80 keV
X-ray Powder Diffraction PDF: Pair Distribution Function In situ Scattering Small Molecule Diffraction X-ray Diffraction High Pressure

I02-1 VMXm

Commissioning

VMXm is a micro/nanofocus MX beamline aimed at atomic structure determination in cases where the production of significant quantities of protein material and crystals is problematic.

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Beamsize: 0.3x0.5 - 10x13 (variable size)
Detector: Pilatus3 6M (Si) and Eiger2 X 9M (CdTe)
Wavelength: 0.44 - 1.77 Å
Energy: 7.0 - 28.0 keV
Microfocus Macromolecular Crystallography XRF: X-ray Fluorescence X-ray Diffraction MAD: Multi Wavelength Anomalous Diffraction

I04-1 Fixed wavelength MX

High throughput and highly automated fixed wavelength SAD beamline for macromolecular crystallography.

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Beamsize: 60 x 50
Detector: Pilatus 6M-F
Wavelength: 0.92Å (fixed)
Multi-axis Goniometry X-ray Diffraction Macromolecular Crystallography Remote Access

I03 MX

High throughput and fully automated beamline for optimised MX experiments. Capable of accepting CL3 type experiments on crystals of pathogens.

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Beamsize: 90 µm x 30 µm
Detector: Eiger2 XE 16M
Wavelength: 0.5 - 2.5 Å
In situ Multi-axis Goniometry Humidity Control Biocontainment Macromolecular Crystallography MAD: Multi Wavelength Anomalous Diffraction Remote Access X-ray Diffraction

I23 Long-Wavelength MX

Operational in optimisation mode

A unique facility for solving the crystallographic phase problem, using the small anomalous signals from sulphur or phosphorous which are present in native protein or RNA/DNA crystals. Additionally, anomalous difference Fourier maps can be used to locate sulphur and phosphorous positions to assist model building at low resolution and/or identify lighter atoms such as chlorine, potassium and calcium.

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Wavelength: 1.1 – 5.9 Å
Energy: 2.1 – 11 keV
Multi-axis Goniometry Macromolecular Crystallography Long Wavelength MX MAD: Multi Wavelength Anomalous Diffraction X-ray Diffraction

I04 Microfocus MX

Variable focus from 5 to 100 microns, high throughput and highly automated beamline for optimised MAD and SAD experiments.

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Beamsize: 10 µm x 5 µm - 110 µm x 100 µm
Detector: Eiger2 XE 16M
Wavelength: 0.69 - 2.07 Å
Microfocus Multi-axis Goniometry Humidity Control Macromolecular Crystallography MAD: Multi Wavelength Anomalous Diffraction Remote Access X-ray Diffraction

I24 Microfocus MX

High throughput variable microfocus beamline for optimised MAD and SAD experiments on crystals down a few microns in size.

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Beamsize: 5x5 - 50x40 (variable aspect ratio)
Detector: Pilatus3 6M
Wavelength: 0.62Å - 1.77Å
Microfocus Spectroscopy In situ Multi-axis Goniometry Humidity Control Biocontainment Macromolecular Crystallography SSX: Serial Synchrotron X-ray Crystallography MAD: Multi Wavelength Anomalous Diffraction Remote Access X-ray Diffraction

I02-2 VMXi

Operational in optimisation mode

The Versatile Macromolecular X-tallography in-situ (VMXi) beamline will be an entirely automated facility for characterisation of, and data collection directly from, crystallisation experiments in situ.

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Beamsize: 10 µm x 10 µm
Energy: 16 keV
Microfocus In situ Macromolecular Crystallography Imaging MAD: Multi Wavelength Anomalous Diffraction X-ray Diffraction

Diamond Light Source

Diamond Light Source is the UK's national synchrotron science facility, located at the Harwell Science and Innovation Campus in Oxfordshire.

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Registered in England and Wales at Diamond House, Harwell Science and Innovation Campus, Didcot, Oxfordshire, OX11 0DE, United Kingdom. Company number: 4375679. VAT number: 287 461 957. Economic Operators Registration and Identification (EORI) number: GB287461957003.

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