Welcome to Imaging and Microscopy
I08 Scanning X-ray Microscopy
Scanning X-ray Microscopy with variety of imaging and spectomicroscopy modes: Transmission incl. absorption and phase-sensitive contrasts, and X-ray fluorescence.
More informationEnergy: 0.25 - 4.2 keV
K11 DIAD: Dual Imaging and Diffraction
Under construction
DIAD will be the a dual beam instrument capable of imaging and diffraction at the same time at the micron scale. The beamline will enable in-situ experiments aiming to resolve the 3D microstructure (via imaging) and phase constitution/strain state of material (via diffraction) in quasi-simultaneously matter with switching times of a few Hz between analysis techniques.
More informationDetector: PCO.edge or equivalent, Pilatus Dectris 2M CdTe
Energy: 7-38 keV
I12 JEEP: Joint Engineering, Environment and Processing
I12 is a high-energy beamline principally for Material Science, Engineering and Processing Science. The instrument’s main focus is to allow in situ studies of samples in environments as close as possible to real world environments using imaging, tomography, diffraction and small-angle scattering. I12 is particularly well suited to study large or dense objects and offers a unique sample and environment installation facility for weights up to 2000 kg.
More informationEnergy: 53 – 150 keV
I13 X-ray Imaging and Coherence
I13 is Diamond’s longest beamline, dedicated to imaging, tomographic and coherence experiments across the biological, medical, geological, material, engineering and archealogical sciences.
More informationePSIC
ePSIC provides scientists with state-of-the-art experimental equipment and expertise in the filed of physical sciences electron microscopy and characterisation. Currently ePSIC offers beam time on two fully operational microscopes: (E01) A probe-corrected JEM ARM200F with EELS and EDX capabilities in collaboration with Johnson Matthey, and (E02) a probe and image corrected JEM ARM300F in collaboration with University of Oxford.
More informationI14 Hard X-ray Nanoprobe
Operational in optimisation mode
The Hard X-ray nanoprobe I14 beamline is a dedicated facility for nanoscale microscopy. The central theme of the beamline is the ability to obtain structural and chemically-specific information on a full range of materials (inorganic/organic) under both static and real (e.g. wet, heated, in-situ strain) conditions.
More informationJ08 Soft X-ray Ptychography
Commissioning
The design and construction of a soft X-ray spectro- and tomo-ptychography branchline (J08) progresses according to plan. This instrument is expected to be available for experiments in the second half of 2019.
Imaging modes: Ptychography, Imaging, Spectroscopy, XRF
More informationEnergy: 0.25 – 2 keV