Imaging and Microscopy - Diamond Light Source

Welcome to Imaging and Microscopy

Imaging and Microscopy is a newly formed science group, which brings together eight experimental facilities (I08, J08, DIAD, I12, I13-1, I13-2, I14 and ePSIC) with a new imaging group leader to coordinate and drive the group’s activities. These facilities use electrons and X-rays to image samples under different experimental conditions across a diverse range of length scales and time scales. Different contrast mechanisms allow for imaging of sample properties such as elemental composition, density and structure and this ability to extract image sample properties in minute detail lends itself to a wide range of scientific areas from chemistry and catalysis to environmental science, materials science, biology, medicine, and cultural heritage.

Instruments

Instruments -

I08 Scanning X-ray Microscopy

Scanning X-ray Microscopy with variety of imaging and spectomicroscopy modes: Transmission incl. absorption and phase-sensitive contrasts, X-ray fluorescence as well as soft X-ray diffraction imaging (ptychography).

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Beamsize: 20 nm
Energy: 0.25 - 4.2 keV

XAS: X-ray Absorption Spectroscopy XRF: X-ray Fluorescence Imaging Spectroscopy PCI: Phase Contrast Imaging Ptychography

K11 DIAD: Dual Imaging and Diffraction

Under construction

DIAD will be the a dual beam instrument capable of imaging and diffraction at the same time at the micron scale. The beamline will enable in-situ experiments aiming to resolve the 3D microstructure (via imaging) and phase constitution/strain state of material (via diffraction) in quasi-simultaneously matter with switching times of a few Hz between analysis techniques.

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Beamsize: Imaging beam: up to 1.7x1.7mm; Diffraction beam: ~ 10 µm
Detector: PCO.edge or equivalent, Pilatus Dectris 2M CdTe
Energy: 7-38 keV

Imaging In situ X-ray Diffraction Microfocus PCI: Phase Contrast Imaging Tomography

I12 JEEP: Joint Engineering, Environment and Processing

I12 is a high-energy beamline principally for Material Science, Engineering and Processing Science. The instrument’s main focus is to allow in situ studies of samples in environments as close as possible to real world environments using imaging, tomography, diffraction and small-angle scattering. I12 is particularly well suited to study large or dense objects and offers a unique sample and environment installation facility for weights up to 2000 kg.

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Beamsize: From 30 micrometer x 30 micrometer to 50 mm x 15 mm (EH1) or 100 mm x 30 mm (EH2)
Energy: 53 – 150 keV

EDD: Energy Dispersive Diffraction Imaging SAXS: Small Angle X-ray Scattering X-ray Diffraction PCI: Phase Contrast Imaging Tomography X-ray Powder Diffraction Scattering High Pressure

I13 X-ray Imaging and Coherence

I13 is Diamond’s longest beamline, dedicated to imaging, tomographic and coherence experiments across the biological, medical, geological, material, engineering and archealogical sciences.

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Energy: Imaging branch: 8 - 30 keV; Coherence branch: 6 - 20 keV

Imaging PCI: Phase Contrast Imaging Tomography Ptychography Bragg CDI CDI: Coherent Diffraction Imaging

ePSIC

ePSIC provides scientists with state-of-the-art experimental equipment and expertise in the filed of physical sciences electron microscopy and characterisation. Currently ePSIC offers beam time on two fully operational microscopes: (E01) A probe-corrected JEM ARM200F with EELS and EDX capabilities in collaboration with Johnson Matthey, and (E02) a probe and image corrected JEM ARM300F in collaboration with University of Oxford.

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Accelerating Voltages: 30 - 300 kV

Electron Microscope EELS: Electron Energy Loss Spectroscopy EDX: Energy-dispersive X-ray Spectroscopy Imaging Electron Crystallography Imaging Ptychography

I14 Hard X-ray Nanoprobe

Operational in optimisation mode

The Hard X-ray nanoprobe I14 beamline is a dedicated facility for nanoscale microscopy. The central theme of the beamline is the ability to obtain structural and chemically-specific information on a full range of materials (inorganic/organic) under both static and real (e.g. wet, heated, in-situ strain) conditions.

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Energy: 5 - 25 keV

XAS: X-ray Absorption Spectroscopy XRF: X-ray Fluorescence Imaging X-ray Diffraction nXRD: nano X-ray Diffraction Ptychography Spectroscopy PCI: Phase Contrast Imaging

J08 Soft X-ray Ptychography

Under construction

The design and construction of a soft X-ray spectro- and tomo-ptychography branchline (J08) progresses according to plan. This instrument is expected to be available for experiments in the second half of 2019.

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Ptychography Spectroscopy Imaging PCI: Phase Contrast Imaging