SXD: Surface X-ray Diffraction

Surface X-ray Diffraction (SXD) is part of the family of diffraction, but concentrates on the surface of a sample and the interface between materials. SXD can determine the atomic structure of an ordered crystal surface, as well as measuring the lattice constants and thermal vibration amplitudes (Debye-Waller factors). Due to the natural penetration depth of X-rays, they can obtain information about interfaces within a structure.

Relevant Instrument(s)

I07 Surface and Interface Diffraction

I07 is a high-resolution X-ray diffraction beamline for investigating the structure of surfaces and interfaces under different environmental conditions, including, for example, semiconductors and biological films.

More information

Wavelength: 0.4 - 2.0 Å
Energy: 6 - 30 keV

X-ray Diffraction XRR: X-ray Reflectivity Spectroscopy GIXD: Grazing Incidence X-ray Diffraction SXRD: Surface X-ray Diffraction GISAXS: Grazing Incidence SAXS GIWAXS: Grazing Incidence WAXS SAXS: Small Angle X-ray Scattering Surface X-ray Diffraction Scattering

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SXD: Surface X-ray Diffraction

Relevant Instrument(s)

I07 Surface and Interface Diffraction