User Publications
These papers are all based at least in part on data gathered on beamline B16. If you have published a paper based on data from B16 which doesn't appear here, please send a reference (ideally including a DOI) to us.
Ultra-fast low temperature scintillation and X-ray luminescence of CsPbCl 3 crystals V. B. Mykhaylyk, M. Rudko, H. Kraus, V. Kapustianyk, V. Kolomiets, N. Vitoratou, Y. Chornodolskyy, A. S. Voloshinovskii, L. Vasylechko
Journal Of Materials Chemistry C, 10 Dec 2022 DOI: 10.1039/D2TC04631H Two-dimensional speckle technique for slope error measurements of weakly focusing reflective X-ray optics Lingfei Hu, Hongchang Wang, Oliver Fox, Kawal Sawhney
Journal Of Synchrotron Radiation, 29 Nov 2022 DOI: 10.1107/S160057752200916X First observation of new flat line Fano profile via an X-ray planar cavity Zi-Ru Ma, Xin-Chao Huang, Tian-Jun Li, Hong-Chang Wang, Gen-Chang Liu, Zhan-Shan Wang, Bo Li, Wen-Bin Li, Lin-Fan Zhu
Physical Review Letters, 129 Nov 2022 DOI: 10.1103/PhysRevLett.129.213602 Active region extent assessment with X-rays (AREA-X) Luise Poley, Andrew Blue, Vitaliy Fadeyev, Dennis Sperlich
Journal Of Instrumentation, 17 Nov 2022 DOI: 10.1088/1748-0221/17/11/T11009 Practical implementations of speckle-based phase-retrieval methods in Python and GPU for tomography Nghia T. Vo, Hongchang Wang, Lingfei Hu, Tunhe Zhou, Marie-~christine Zdora, Hans Deyhle, Robert C. Atwood, Michael Drakopoulos
Oct 2022 DOI: 10.1117/12.2636834 Conference Paper B16-Test Beamline I12-JEEP: Joint Engineering, Environmental and Processing A novel synchrotron technique offers insights into high-performance composite materials Diamond Light Source
Oct 2022 Science Highlight B16-Test Beamline
X-ray diffraction imaging of fully packaged n–p–n transistors under accelerated ageing conditions Brian K. Tanner, Andreas Danilewsky, Patrick J. Mcnally
Journal Of Applied Crystallography, 55 Oct 2022 DOI: 10.1107/S1600576722007142 Single-orientation colloidal crystals from capillary-action-induced shear Nicholas H. P. Orr, Taiki Yanagishima, Igor P. Dolbnya, Andrei V. Petukhov, Roel P. A. Dullens
The Journal Of Chemical Physics, Oct 2022 DOI: 10.1063/5.0112602 Carbon fibre lattice strain mapping via microfocus synchrotron X-ray diffraction of a reinforced composite Jiraphant Srisuriyachot, Sophie A. M. Mcnair, Yang Chen, Thomas Barthelay, Rob Gray, Jean Bénézech, Igor P. Dolbnya, Richard Butler, Alexander J. G. Lunt
Carbon, 194 Aug 2022 DOI: 10.1016/j.carbon.2022.08.041 Probing interdendritic flow and hot tearing during solidification using real time X-ray imaging and droplet tracking E. Liotti, A. Lui, T. Connolley, P. S. Grant
Acta Materialia, 20 Aug 2022 DOI: 10.1016/j.actamat.2022.118298 Fast wavefront sensing for X-ray optics with an alternating speckle tracking technique Lingfei Hu, Hongchang Wang, Oliver Fox, Kawal Sawhney
Optics Express, 30 Aug 2022 DOI: 10.1364/OE.460163 Grain structure engineering of NiTi shape memory alloys by intensive plastic deformation Zifan Wang, Jingwei Chen, Radim Kocich, Samuel Tardif, Igor P. Dolbnya, Lenka Kunčická, Jean-Sébastien Micha, Konstantinos Liogas, Oxana Magdysyuk, Ivo Szurman, Alexander M. Korsunsky
Acs Applied Materials & Interfaces, June 2022 DOI: 10.1021/acsami.2c05939 Journal Paper B16-Test Beamline E01-JEM ARM 200CF I12-JEEP: Joint Engineering, Environmental and Processing open access Two-dimensional wavefront characterization of adaptable corrective optics and Kirkpatrick–Baez mirror system using ptychography Thomas E. J. Moxham, Vishal Dhamgaye, David Laundy, Oliver J. L. Fox, Hossein Khosroabadi, Kawal Sawhney, Alexander Korsunsky
Optics Express, 30 May 2022 DOI: 10.1364/OE.453239 Influence of microdefects in rust layer of weathering steel on corrosion resistance from 3D observation by synchrotron X-ray micro tomography Shunichi Tachibana, Biao Cai, Alison Davenport, Shinichi Miura, Hongchang Wang, Igor P. Dolbnya
Materials Today Communications, 83 Feb 2022 DOI: 10.1016/j.mtcomm.2022.103219 Incomplete charge collection at inter-pixel gap in low- and high-flux cadmium zinc telluride pixel detectors Antonino Buttacavoli, Fabio Principato, Gaetano Gerardi, Donato Cascio, Giuseppe Raso, Manuele Bettelli, Andrea Zappettini, Paul Seller, Matthew Veale, Leonardo Abbene
Sensors, 22 Feb 2022 DOI: 10.3390/s22041441 Investigating metal solidification with X-ray imaging Shikang Feng, Insung Han, Andrew Lui, Robin Vincent, Gideon Ring, Patrick S. Grant, Enzo Liotti
Metals, 12 Feb 2022 DOI: 10.3390/met12030395 Determination of correlations between element distributions in bone samples measured with high resolution X-ray element imaging Lukas Warnung
Jan 2022 DOI: 10.34726/hss.2022.86962