User Publications
These papers are all based at least in part on data gathered on beamline B16. If you have published a paper based on data from B16 which doesn't appear here, please send a reference (ideally including a DOI) to us.
Adaptable refractive correctors for X-ray optics David Laundy, Vishal Dhamgaye, Thomas Moxham, Kawal Sawhney
Optica, 6 Dec 2019 DOI: 10.1364/OPTICA.6.001484 Multiscale synchrotron scattering studies of the temperature-dependent changes in the structure and deformation response of a thermoplastic polyurethane elastomer T. Sui, E. Salvati, H. Zhang, I. P. Dolbnya, A. M. Korsunsky
Materials Today Advances, 4 Dec 2019 DOI: 10.1016/j.mtadv.2019.100024 Absolute metrology method of the x-ray mirror with speckle scanning technique Lian Xue, Zhongliang Li, Tunhe Zhou, Xiaohao Dong, Hongxin Luo, Hongchang Wang, Kawal Sawhney, Jie Wang
Applied Optics, 58 Nov 2019 DOI: 10.1364/AO.58.008658 Nano-scale residual stress depth profiling in Cu/W nano-multilayers as a function of magnetron sputtering pressure Leon Romano Brandt, Enrico Salvati, Eric Le Bourhis, Thomas Moxham, Igor P. Dolbnya, Alexander M. Korsunsky
Surface And Coatings Technology, Nov 2019 DOI: 10.1016/j.surfcoat.2019.125142 Analysis of basal plane dislocation dynamics in PVT-grown 4H-SiC crystals during high temperature treatment Balaji Raghothamachar, Yu Yang, Jianqiu Guo, Michael Dudley
Ecs Transactions, 92 Oct 2019 DOI: 10.1149/09207.0131ecst Polar transformation of 2D X-ray diffraction patterns and the experimental validation of the hdic technique Fatih Uzun, Alexey I. Salimon, Eugene S. Statnik, Cyril Besnard, Jingwei Chen, Thomas Moxham, Enrico Salvati, Zifan Wang, Alexander M. Korsunsky
Measurement, Oct 2019 DOI: 10.1016/j.measurement.2019.107193 Investigations into the interface failure of yttria partially stabilised zirconia - porcelain dental prostheses through microscale residual stress and phase quantification Alexander Lunt, Enrico Salvati, Nikolaos Baimpas, Igor Dolbnya, Tee Khin Neo, Alexander Korsunsky
Dental Materials, Sept 2019 DOI: 10.1016/j.dental.2019.08.098 In-operando X-ray diffraction imaging of thermal strains in fully packaged silicon devices B. K. Tanner, R. K. Vijayaraghavan, B. Roarty, A. N. Danilewsky, P. J. Mcnally
Microelectronics Reliability, 99 Aug 2019 DOI: 10.1016/j.microrel.2019.06.006 Datasets for multi-scale diffraction analysis (synchrotron XRD and EBSD) of twinning-detwinning during tensile-compressive deformation of AZ31B magnesium alloy samples Hongjia Zhang, Antoine Jérusalem, Enrico Salvati, Chrysanthi Papadaki, Kai Soon Fong, Xu Song, Alexander M. Korsunsky
Data In Brief, Aug 2019 DOI: 10.1016/j.dib.2019.104423 Polar transformation of 2D X-ray diffraction patterns for 2D strain evaluation Eugene S. Statnik, Alexei I. Salimon, Fatih Uzun, Alexander M. Korsunsky
Jul 2019 Conference Paper B16-Test Beamline
Transverse fatigue behaviour and residual stress analyses of double sided FSW aluminium alloy joints Enrico Salvati, Joris Everaerts, Koji Kageyama, Alexander M. Korsunsky
Fatigue & Fracture Of Engineering Materials & Structures, 42 June 2019 DOI: 10.1111/ffe.13068 A stacked prism lens concept for next-generation hard X-ray telescopes Wujun Mi, Peter Nillius, Mark Pearce, Mats Danielsson
Nature Astronomy, 3 June 2019 DOI: 10.1038/s41550-019-0795-y Bright and fast scintillation of organolead perovskite MAPbBr 3 at low temperatures Vitaliy B. Mykhaylyk, Hans Kraus, Michael Saliba
Materials Horizons, 2 May 2019 DOI: 10.1039/C9MH00281B Elemental imaging of trace elements in bone samples using micro and nano-X-ray fluorescence spectrometry C. Streli, M. Rauwolf, A. Turyanskaya, D. Ingerle, P. Wobrauschek
Applied Radiation And Isotopes, Apr 2019 DOI: 10.1016/j.apradiso.2019.04.033 Mapping the depleted area of silicon diodes using a micro-focused X-ray beam L. Poley, A. Blue, I. Bloch, C. Buttar, V. Fadeyev, J. Fernandez-Tejero, C. Fleta, J. Hacker, C. Lacasta Llacer, M. Miñano, M. Renzmann, E. Rossi, C. Sawyer, D. Sperlich, M. Stegler, M. Ullán, Y. Unno
Journal Of Instrumentation, 14 Mar 2019 DOI: 10.1088/1748-0221/14/03/P03024 Increased count-rate performance and dose efficiency for silicon photon-counting detectors for full-field CT using an ASIC with adjustable shaping time Christel Sundberg, Mats Persson, Andreas Ehliar, Martin Sjölin, Jacob Wikner, Mats Danielsson
Mar 2019 DOI: 10.1117/12.2512826 Optimized alignment of X-ray mirrors with an automated speckle-based metrology tool T. Zhou, H. Wang, O. J. L. Fox, K. J. S. Sawhney
Review Of Scientific Instruments, 90 Feb 2019 DOI: 10.1063/1.5057712 Multi-scale mechanisms of twinning-detwinning in magnesium alloy AZ31B simulated by crystal plasticity modeling and validated via in situ synchrotron XRD and in situ SEM-EBSD Hongjia Zhang, Antoine Jérusalem, Enrico Salvati, Chrysanthi Papadaki, Kai Soon Fong, Xu Song, Alexander M. Korsunsky
International Journal Of Plasticity, Feb 2019 DOI: 10.1016/j.ijplas.2019.02.018 Grain rotation during twin-detwin deformation of Mg AZ31 alloy using in situ XRD and EBSD Hong Jia Zhang, Enrico Salvati, Chrysanthi Papadaki, Kai Soon Fong, Xu Song, Alexander M. Korsunsky
Key Engineering Materials, 793 Jan 2019 DOI: 10.4028/www.scientific.net/KEM.793.17 X-ray computational ghost imaging with single-pixel detector Y. Klein, A. Schori, I. P. Dolbnya, K. Sawhney, S. Shwartz
Optics Express, 27 Jan 2019 DOI: 10.1364/OE.27.003284 Spatially resolved mapping of phase transitions in liquid-crystalline materials by X-ray birefringence imaging Yating Zhou, Rhian Patterson, Benjamin A. Palmer, Gregory Edwards-Gau, Benson M. Kariuki, N. S. Saleesh Kumar, Duncan W. Bruce, Igor P. Dolbnya, Stephen P. Collins, Andrew Malandain, Kenneth D. M. Harris
Chemical Science, 33 Jan 2019 DOI: 10.1039/C8SC05285A Development of pseudo-perfect x-ray optics using refractive compensators Kawal Sawhney, David Laundy, Tom Moxham, Oliver Fox, Vishal Dhamgaye
Jan 2019 DOI: 10.1063/1.5084634 Optical elements for dynamically broadening the focus of micro-focus optics at synchrotron x-ray sources David Laundy, Kawal Sawhney, Vishal Dhamgaye, Graham Duller, Gwyndaf Evans, Jose Trincao, Anna Warren
Jan 2019 DOI: 10.1063/1.5084637