Optics & MetrologyB16 Contact
Beamline Phone Number:
+44 (0) 1235 778917
Principal Beamline Scientist:
Kawal Sawhney
Tel: +44 (0) 1235 778169
E-mail: [email protected]
B16 Test Beamline
Status: Operational
Energy: 4 - 45 keV
User Publications
These papers are all based at least in part on data gathered on beamline B16. If you have published a paper based on data from B16 which doesn't appear here, please send a reference (ideally including a DOI) to us.
15 items found for 2012 [total: 383]
Diffraction post-processing of 3D dislocation dynamics simulations for direct comparison with micro-beam Laue experiments Materials Letters, 89 Dec 2012 DOI: 10.1016/j.matlet.2012.08.052
Journal Paper B16-Test Beamline
Characterisation of III-nitride materials by synchrotron X-ray microdiffraction reciprocal space mapping Physica Status Solidi (c), Dec 2012 DOI: 10.1002/pssc.201200596
Journal Paper B16-Test Beamline
Ni layer thickness dependence of the interface structures for Ti/Ni/Ti trilayer studied by X-ray standing waves Acs Applied Materials & Interfaces, 5 (2) Dec 2012 DOI: 10.1021/am3024614
Journal Paper B16-Test Beamline
X-ray multimodal imaging using a random-phase object Physical Review A, 86 (6) Dec 2012 DOI: 10.1103/PhysRevA.86.063813
Journal Paper B16-Test Beamline
X-ray beam monitor made by thin-film CVD single-crystal diamond Journal Of Synchrotron Radiation, 19 (6) Nov 2012 DOI: 10.1107/S0909049512038186
Journal Paper B16-Test Beamline
High-resolution high-efficiency X-ray imaging system based on the in-line Bragg magnifier and the Medipix detector Journal Of Synchrotron Radiation, Nov 2012 DOI: 10.1107/S0909049512044366
Journal Paper B16-Test Beamline
X-ray birefringence: a new strategy for determining molecular orientation in materials The Journal Of Physical Chemistry Letters, 3 (21) Nov 2012 DOI: 10.1021/jz3013547
Journal Paper B16-Test Beamline
Functional characterization of planar sensors with active edges using laser and X-ray beam scans Nuclear Instruments And Methods In Physics Research Section A: Accelerators, Spectrometers, Detectors And Associated Equipment, 718 Sept 2012 DOI: 10.1016/j.nima.2012.09.035
Journal Paper B16-Test Beamline
Shearing interferometer spatial resolution for at-wavelength hard X-ray metrology Aip Conference Proceedings, 1466 Aug 2012 DOI: 10.1063/1.4742295
Conference Paper B16-Test Beamline
Characterization of edgeless CdTe detectors for use in hard X-ray imaging applications Ieee Transactions On Nuclear Science, 59 (4) Aug 2012 DOI: 10.1109/TNS.2012.2197025
Journal Paper B16-Test Beamline
Characterization of a one dimensional focusing compound refractive lens using the rotating shearing interferometer technique Aip Conference Proceedings, 1466 Aug 2012 DOI: 10.1063/1.4742296
Conference Paper B16-Test Beamline
X-ray micro-beam characterization of a small pixel spectroscopic CdTe detector Journal Of Instrumentation, 7 Jul 2012 DOI: 10.1088/1748-0221/7/07/P07017
Journal Paper B16-Test Beamline
Prediction of the propagation probability of individual cracks in brittle single crystal materials Applied Physics Letters, 101 (4) Jul 2012 DOI: 10.1063/1.4738994
Journal Paper B16-Test Beamline
X-ray submicrometer phase contrast imaging with a Fresnel zone plate and a two dimensional grating interferometer Optics Letters, 37 May 2012 DOI: 10.1364/OL.37.001622
Journal Paper B16-Test Beamline
Geometrical factor correction in grazing incident x-ray fluorescence experiment Review Of Scientific Instruments, 83 (5) May 2012 DOI: 10.1063/1.4722495
Journal Paper B16-Test Beamline
- Felix Hofmann, Sinéad Keegan, Alexander M. Korsunsky, "Diffraction post-processing of 3D dislocation dynamics simulations for direct comparison with micro-beam Laue experiments", Materials Letters, 89, 66 - 69 (2012), DOI: 10.1016/j.matlet.2012.08.052
- Vyacheslav Kachkanov, Igor Dolbnya, Kevin O'Donnell, Katharina Lorenz, Sergio Pereira, Ian Watson, Thomas Sadler, Haoning Li, Vitaly Zubialevich, Peter Parbrook, "Characterisation of III-nitride materials by synchrotron X-ray microdiffraction reciprocal space mapping", Physica Status Solidi (c) (2012), DOI: 10.1002/pssc.201200596
- Wenbin Li, Jingtao Zhu, Haochuan Li, Zhong Zhang, Xiaoying Ma, Xiaoyue Yang, Hongchang Wang, Zhanshan Wang, "Ni layer thickness dependence of the interface structures for Ti/Ni/Ti trilayer studied by X-ray standing waves", Acs Applied Materials & Interfaces, 5 (2) (2012), DOI: 10.1021/am3024614
- Sebastien Berujon, Hongchang Wang, Kawal Sawhney, "X-ray multimodal imaging using a random-phase object", Physical Review A, 86 (6) (2012), DOI: 10.1103/PhysRevA.86.063813
- M. Marinelli, E. Milani, G. Prestopino, C. Verona, G. Verona-Rinati, M. Angelone, M. Pillon, V. Kachkanov, N. Tartoni, M. Benetti, D. Cannatà, F. Di Pietrantonio, "X-ray beam monitor made by thin-film CVD single-crystal diamond", Journal Of Synchrotron Radiation, 19 (6), 1015 - 1020 (2012), DOI: 10.1107/S0909049512038186
- Patrik Vagovic, Dusan Korytar, Angelica Cecilia, Elias Hamann, Libor Sveda, Daniele Pelliccia, Jurgen Hartwig, Peter Oberta, Igor Dolbnya, Kawal Sawhney, Uwe Fleschig, Michael Fiederle, Tilo Baumbach, "High-resolution high-efficiency X-ray imaging system based on the in-line Bragg magnifier and the Medipix detector", Journal Of Synchrotron Radiation (2012), DOI: 10.1107/S0909049512044366
- Benjamin Palmer, Gregory Edwards-Gau, Anabel Morte-Rodenas, Benson M. Kariuki, Gin Keat Lim, Kenneth D. M. Harris, Igor Dolbnya, Stephen P. Collins, "X-ray birefringence: a new strategy for determining molecular orientation in materials", The Journal Of Physical Chemistry Letters, 3 (21), 3216 - 3222 (2012), DOI: 10.1021/jz3013547
- M. Povoli, A. Bagolini, M. Boscardin, G.-F. Dalla Betta, G. Giacomini, J. Hasi, A. Oh, N. Zorzi, "Functional characterization of planar sensors with active edges using laser and X-ray beam scans", Nuclear Instruments And Methods In Physics Research Section A: Accelerators, Spectrometers, Detectors And Associated Equipment, 718 (2012), DOI: 10.1016/j.nima.2012.09.035
- [Conference Paper] Sebastien Berujon, Hongchang Wang, Eric Ziegler, Kawal Sawhney, "Shearing interferometer spatial resolution for at-wavelength hard X-ray metrology", Aip Conference Proceedings, 1466, 217-222 (2012), DOI: 10.1063/1.4742295
- Matthew C. Veale, Steven J. Bell, Lawrence L. Jones, Paul Seller, Matthew D. Wilson, Robert C. Cernik, Juha Kalliopuska, Harri Pohjonen, Hans Andersson, Seppo Nenonen, Vyacheslav Kachkanov, "Characterization of edgeless CdTe detectors for use in hard X-ray imaging applications", Ieee Transactions On Nuclear Science, 59 (4), 1-8 (2012), DOI: 10.1109/TNS.2012.2197025
- [Conference Paper] Hongchang Wang, Sebastien Berujon, Kawal Sawhney, "Characterization of a one dimensional focusing compound refractive lens using the rotating shearing interferometer technique", Aip Conference Proceedings, 1466, 223-228 (2012), DOI: 10.1063/1.4742296
- M. C. Veale, S. J. Bell, P. Seller, M. D. Wilson, V. Kachkanov, "X-ray micro-beam characterization of a small pixel spectroscopic CdTe detector", Journal Of Instrumentation, 7, P07017 - P07017 (2012), DOI: 10.1088/1748-0221/7/07/P07017
- B. K. Tanner, M. C. Fossati, J. Garagorri, M. R. Elizalde, D. Allen, P. J. Mcnally, D. Jacques, J. Wittge, A. N. Danilewsky, "Prediction of the propagation probability of individual cracks in brittle single crystal materials", Applied Physics Letters, 101 (4) (2012), DOI: 10.1063/1.4738994
- S. Berujon, H. Wang, I. Pape, S. Rutishauser, C. David, K. Sawhney, "X-ray submicrometer phase contrast imaging with a Fresnel zone plate and a two dimensional grating interferometer", Optics Letters, 37, 1622-1624 (2012), DOI: 10.1364/OL.37.001622
- Wenbin Li, Jingtao Zhu, Xiaoying Ma, Haochuan Li, Hongchang Wang, Kawal J. S. Sawhney, Zhanshan Wang, "Geometrical factor correction in grazing incident x-ray fluorescence experiment", Review Of Scientific Instruments, 83 (5) (2012), DOI: 10.1063/1.4722495
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