Optics & MetrologyB16 Contact
Beamline Phone Number:
+44 (0) 1235 778917
Principal Beamline Scientist:
Kawal Sawhney
Tel: +44 (0) 1235 778169
E-mail: [email protected]
B16 Test Beamline
Status: Operational
Energy: 4 - 45 keV
User Publications
These papers are all based at least in part on data gathered on beamline B16. If you have published a paper based on data from B16 which doesn't appear here, please send a reference (ideally including a DOI) to us.
21 items found for 2017 [total: 383]
Characterisation of the high dynamic range Large Pixel Detector (LPD) and its use at X-ray free electron laser sources Journal Of Instrumentation, 12 Dec 2017 DOI: 10.1088/1748-0221/12/12/P12003
Journal Paper B16-Test Beamline
Structural evolution of PCL during melt extrusion 3D printing Macromolecular Materials And Engineering, 2 Dec 2017 DOI: 10.1002/mame.201700494
Journal Paper B16-Test Beamline
Quantitative imaging of the stress/strain fields and generation of macroscopic cracks from indents in silicon Crystals, 7 Nov 2017 DOI: 10.3390/cryst7110347
X-ray metrology of an array of active edge pixel sensors for use at synchrotron light sources Nuclear Instruments And Methods In Physics Research Section A: Accelerators, Spectrometers, Detectors And Associated Equipment, Oct 2017 DOI: 10.1016/j.nima.2017.09.023
Journal Paper B16-Test Beamline
Speckle-based portable device for in-situ metrology of x-ray mirrors at Diamond Light Source Null, Sept 2017 DOI: 10.1117/12.2274780
Speckle-based at-wavelength metrology of x-ray optics at Diamond Light Source Null, Aug 2017 DOI: 10.1117/12.2274781
Physical and chemical processes for gold nanoparticles and ionising radiation in medical contexts Aug 2017 DOI: 10.1142/9781786341259_0015
Investigations into the impact of locally modified sensor architectures on the detection efficiency of silicon micro-strip sensors Journal Of Instrumentation, 12 Jul 2017 DOI: 10.1088/1748-0221/12/07/P07006
Using refractive optics to broaden the focus of an X-ray mirror Journal Of Synchrotron Radiation, 24 Jul 2017 DOI: 10.1107/S1600577517006038
First tests of a novel radiation hard CMOS sensor process for Depleted Monolithic Active Pixel Sensors Journal Of Instrumentation, 12 June 2017 DOI: 10.1088/1748-0221/12/06/P06008
Pulse picker for synchrotron radiation driven by a surface acoustic wave Optics Letters, 42 May 2017 DOI: 10.1364/OL.42.001915
An iterative method for near-field Fresnel region polychromatic phase contrast imaging Journal Of Optics, May 2017 DOI: 10.1088/2040-8986/aa72c4
Measuring warped microchips May 2017
Science Highlight B16-Test Beamline
Strain softening of nano-scale fuzzy interfaces causes Mullins effect in thermoplastic polyurethane Scientific Reports, 7 Apr 2017 DOI: 10.1038/s41598-017-00904-3
Nondestructive X-ray diffraction measurement of warpage in silicon dies embedded in integrated circuit packages Journal Of Applied Crystallography, 50 Apr 2017 DOI: 10.1107/S1600576717003132
Structural and optical properties of oxygen doped single crystal ZnTe grown by multi-tube physical vapour transport Journal Of Materials Science: Materials In Electronics, 95 Apr 2017 DOI: 10.1007/s10854-017-7004-5
Journal Paper B16-Test Beamline
Paternal low protein diet programs preimplantation embryo gene expression, fetal growth and skeletal development in mice Biochimica Et Biophysica Acta (bba) - Molecular Basis Of Disease, Feb 2017 DOI: 10.1016/j.bbadis.2017.02.009
Journal Paper B16-Test Beamline
Radiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1 Journal Of Instrumentation, 12 Feb 2017 DOI: 10.1088/1748-0221/12/02/P02010
MHz rate X-Ray imaging with GaAs:Cr sensors using the LPD detector system Journal Of Instrumentation, 12 Feb 2017 DOI: 10.1088/1748-0221/12/02/P02015
Journal Paper B16-Test Beamline
Probing the deformation and fracture properties of Cu/W nano-multilayers by in situ SEM and synchrotron XRD strain microscopy Surface And Coatings Technology, Jan 2017 DOI: 10.1016/j.surfcoat.2017.01.065
Journal Paper B16-Test Beamline
Probing the nano-scale architecture of diamond-patterned electrospun fibre mats by synchrotron small angle X-ray scattering Rsc Advances, 7 Jan 2017 DOI: 10.1039/C6RA25770D
- M. C. Veale, P. Adkin, P. Booker, J. Coughlan, M. J. French, M. Hart, T. Nicholls, A. Schneider, P. Seller, I. Pape, K. Sawhney, G. A. Carini, P. A. Hart, "Characterisation of the high dynamic range Large Pixel Detector (LPD) and its use at X-ray free electron laser sources", Journal Of Instrumentation, 12, P12003 - P12003 (2017), DOI: 10.1088/1748-0221/12/12/P12003
- Fengyuan Liu, Cian Vyas, Gowsihan Poologasundarampillai, Ian Pape, Sri Hinduja, Wajira Mirihanage, Paulo Bartolo, "Structural evolution of PCL during melt extrusion 3D printing", Macromolecular Materials And Engineering, 2 (2017), DOI: 10.1002/mame.201700494
- Brian K. Tanner, David Allen, Jochen Wittge, Dany Danilewsky, Jorge Garagorri, Eider Gorostegui-Colinas, M. Reyes Elizalde, Patrick J. Mcnally, "Quantitative imaging of the stress/strain fields and generation of macroscopic cracks from indents in silicon", Crystals, 7 (2017), DOI: 10.3390/cryst7110347
- R. Plackett, K. Arndt, D. Bortoletto, I. Horswell, G. Lockwood, I. Shipsey, N. Tartoni, S. Williams, "X-ray metrology of an array of active edge pixel sensors for use at synchrotron light sources", Nuclear Instruments And Methods In Physics Research Section A: Accelerators, Spectrometers, Detectors And Associated Equipment (2017), DOI: 10.1016/j.nima.2017.09.023
- [Conference Paper] Hongchang Wang, Tunhe Zhou, Yogesh Kashyap, Kawal Sawhney, "Speckle-based portable device for in-situ metrology of x-ray mirrors at Diamond Light Source", Null (2017), DOI: 10.1117/12.2274780
- [Conference Paper] Hongchang Wang, Tunhe Zhou, Yogesh Kashyap, Kawal Sawhney, "Speckle-based at-wavelength metrology of x-ray optics at Diamond Light Source", Null (2017), DOI: 10.1117/12.2274781
- [Book Chapter] Fred Currell, Balder Villagomez-Bernabe, "Physical and chemical processes for gold nanoparticles and ionising radiation in medical contexts" (2017), DOI: 10.1142/9781786341259_0015
- L. Poley, K. Lohwasser, A. Blue, M. Benoit, I. Bloch, S. Díez, V. Fadeyev, B. Gallop, A. Greenall, I.-M. Gregor, J. Keller, C. Lacasta, D. Maneuski, L. Meng, M. Milovanovic, I. Pape, P. W. Phillips, L. Rehnisch, K. Sawhney, C. Sawyer, D. Sperlich, M. Stegler, Y. Unno, M. Warren, E. Yildirim, "Investigations into the impact of locally modified sensor architectures on the detection efficiency of silicon micro-strip sensors", Journal Of Instrumentation, 12, P07006 - P07006 (2017), DOI: 10.1088/1748-0221/12/07/P07006
- David Laundy, Kawal Sawhney, Vishal Dhamgaye, "Using refractive optics to broaden the focus of an X-ray mirror", Journal Of Synchrotron Radiation, 24 (2017), DOI: 10.1107/S1600577517006038
- H. Pernegger, Richard Bates, Craig Buttar, M. Dalla, J. W. Van Hoorne, T. Kugathasan, D. Maneuski, L. Musa, P. Riedler, C. Riegel, C. Sbarra, D. Schaefer, E. J. Schioppa, W. Snoeys, "First tests of a novel radiation hard CMOS sensor process for Depleted Monolithic Active Pixel Sensors", Journal Of Instrumentation, 12, P06008 - P06008 (2017), DOI: 10.1088/1748-0221/12/06/P06008
- Simone Vadilonga, Ivo Zizak, Dmitry Roshchupkin, Andrei Petsiuk, Igor Dolbnya, Kawal Sawhney, Alexei Erko, "Pulse picker for synchrotron radiation driven by a surface acoustic wave", Optics Letters, 42 (2017), DOI: 10.1364/OL.42.001915
- Aidan J. Carroll, Grant Van Riessen, Eugeniu Balaur, Igor Dolbnya, Giang Tran, Andrew Peele, "An iterative method for near-field Fresnel region polychromatic phase contrast imaging", Journal Of Optics (2017), DOI: 10.1088/2040-8986/aa72c4
- [Science Highlight] Diamond Light Source, "Measuring warped microchips" (2017)
- T. Sui, E. Salvati, S. Ying, G. Sun, I. P. Dolbnya, K. Dragnevski, C. Prisacariu, A. M. Korsunsky, "Strain softening of nano-scale fuzzy interfaces causes Mullins effect in thermoplastic polyurethane", Scientific Reports, 7 (2017), DOI: 10.1038/s41598-017-00904-3
- B. K. Tanner, A. N. Danilewsky, R. K. Vijayaraghavan, A. Cowley, P. J. Mcnally, "Nondestructive X-ray diffraction measurement of warpage in silicon dies embedded in integrated circuit packages", Journal Of Applied Crystallography, 50 (2017), DOI: 10.1107/S1600576717003132
- John Mullins, F. Dierre, D. P. Halliday, B. K. Tanner, I. Radley, Z. Kang, C. J. Summers, "Structural and optical properties of oxygen doped single crystal ZnTe grown by multi-tube physical vapour transport", Journal Of Materials Science: Materials In Electronics, 95 (2017), DOI: 10.1007/s10854-017-7004-5
- Adam J. Watkins, Slobodan Sirovica, Ben Stokes, Mark Isaacs, Owen Addison, Richard Martin, "Paternal low protein diet programs preimplantation embryo gene expression, fetal growth and skeletal development in mice", Biochimica Et Biophysica Acta (bba) - Molecular Basis Of Disease (2017), DOI: 10.1016/j.bbadis.2017.02.009
- Kestutis Kanisauskas, A. Affolder, K. Arndt, Richard Bates, M. Benoit, F. Di Bello, A. Blue, D. Bortoletto, M. Buckland, Craig Buttar, P. Caragiulo, D. Das, J. Dopke, A. Dragone, F. Ehrler, V. Fadeyev, Z. Galloway, H. Grabas, I. M. Gregor, P. Grenier, A. Grillo, B. Hiti, M. Hoeferkamp, L. B. A. Hommels, B. T. Huffman, J. John, C. Kenney, J. Kramberger, Z. Liang, I. Mandic, Dzmitry Maneuski, F. Martinez-Mckinney, S. Macmahon, L. Meng, M. Mikuž, D. Muenstermann, R. Nickerson, I. Peric, P. Phillips, R. Plackett, F. Rubbo, J. Segal, S. Seidel, A. Seiden, I. Shipsey, W. Song, M. Staniztki, D. Su, C. Tamma, R. Turchetta, L. Vigani, J. Volk, R. Wang, M. Warren, F. Wilson, S. Worm, Qinglei Xiu, J. Zhang, H. Zhu, "Radiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1", Journal Of Instrumentation, 12, P02010 - P02010 (2017), DOI: 10.1088/1748-0221/12/02/P02010
- M. C. Veale, P. Booker, B. Cline, J. Coughlan, M. Hart, T. Nicholls, A. Schneider, P. Seller, I. Pape, K. Sawhney, A. D. Lozinskaya, V. A. Novikov, O. P. Tolbanov, A. Tyazhev, A. N. Zarubin, "MHz rate X-Ray imaging with GaAs:Cr sensors using the LPD detector system", Journal Of Instrumentation, 12, P02015 - P02015 (2017), DOI: 10.1088/1748-0221/12/02/P02015
- Leon Romano Brandt, Enrico Salvati, Chrysanthi Papadaki, Hongjia Zhang, Siqi Ying, Eric Le Bourhis, Igor Dolbnya, Tan Sui, Alexander M. Korsunsky, "Probing the deformation and fracture properties of Cu/W nano-multilayers by in situ SEM and synchrotron XRD strain microscopy", Surface And Coatings Technology (2017), DOI: 10.1016/j.surfcoat.2017.01.065
- Tan Sui, Kirill Titov, Siqi Ying, Hongjia Zhang, Igor P. Dolbnya, Jin-Chong Tan, Alexander M. Korsunsky, "Probing the nano-scale architecture of diamond-patterned electrospun fibre mats by synchrotron small angle X-ray scattering", Rsc Advances, 7, 8200 - 8204 (2017), DOI: 10.1039/C6RA25770D
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