Optics & MetrologyB16 Contact
Beamline Phone Number:
+44 (0) 1235 778917
Principal Beamline Scientist:
Kawal Sawhney
Tel: +44 (0) 1235 778169
E-mail: [email protected]
B16 Test Beamline
Status: Operational
Energy: 4 - 45 keV
User Publications
These papers are all based at least in part on data gathered on beamline B16. If you have published a paper based on data from B16 which doesn't appear here, please send a reference (ideally including a DOI) to us.
18 items found for 2010 [total: 383]
A planar refractive x-ray lens made of nanocrystalline diamond Journal Of Applied Physics, 108 (12) Dec 2010 DOI: 10.1063/1.3517060
Journal Paper B16-Test Beamline
Evaluation of the radiation hardness and Charge Summing Mode of a Medipix3-based detector with synchrotron radiation Nov 2010 DOI: 10.1109/NSSMIC.2010.5874120
Conference Paper B16-Test Beamline
Dislocation-based plasticity model and micro-beam Laue diffraction analysis of polycrystalline Ni foil: A forward prediction Philosophical Magazine, 90 (30) Oct 2010 DOI: 10.1080/14786435.2010.502149
Journal Paper B16-Test Beamline
Micro-scale characterization of deformation and distortion in ductile (poly)crystals by synchrotron X-ray beams Oct 2010 DOI: 10.1017/S2044820110000031
A novel adaptive bimorph focusing mirror and wavefront corrector with sub-nanometre dynamical figure control Sept 2010 DOI: 10.1117/12.861593
Conference Paper B16-Test Beamline
A Test beamline on Diamond Light Source Aug 2010 DOI: 10.1063/1.3463220
Conference Paper B16-Test Beamline
3D Medipix2 detector characterization with a micro-focused X-ray beam Jul 2010 DOI: 10.1016/j.nima.2010.06.140
Conference Paper B16-Test Beamline
Region-of-interest tomography using filtered backprojection: assessing the practical limits Journal Of Microscopy, June 2010 DOI: 10.1111/j.1365-2818.2010.03408.x
Journal Paper B16-Test Beamline
High throughput X-ray diffraction analysis of combinatorial polycrystalline thin film libraries Analytical Chemistry, 82 (11) May 2010 DOI: 10.1021/ac100572h
Journal Paper B16-Test Beamline
Mapping of domain structure in Barium Titanate single crystals by synchrotron X-ray topography Mar 2010 DOI: 10.1117/12.845837
Conference Paper B16-Test Beamline
Chemical vapor deposition diamond based multilayered radiation detector: Physical analysis of detection properties Journal Of Applied Physics, 107 (1) Mar 2010 DOI: 10.1063/1.3275501
Journal Paper B16-Test Beamline
Structural characterization of thin layered materials using x-ray standing wave enhanced elastic and inelastic scattering measurements Journal Of Physics: Condensed Matter, 22 (17) Mar 2010 DOI: 10.1088/0953-8984/22/17/175003
Journal Paper B16-Test Beamline
Synchrotron tests of a 3D Medipix2 X-ray detector Ieee Transactions On Nuclear Science, 57 (1) Feb 2010 DOI: 10.1109/TNS.2009.2037746
Journal Paper B16-Test Beamline
Multilayer mirror as a substrate for total reflection X-ray fluorescence spectrometry Spectrochimica Acta Part B: Atomic Spectroscopy, Feb 2010 DOI: 10.1016/j.sab.2010.02.011
Journal Paper B16-Test Beamline
Application of kinoform lens for X-ray reflectivity analysis Journal Of Synchrotron Radiation, 17 (2) Jan 2010 DOI: 10.1107/S0909049509055009
Journal Paper B16-Test Beamline
Characterization of trace embedded impurities in thin multilayer structures using synchrotron X-ray standing waves Surface And Interface Analysis, 42 (2) Jan 2010 DOI: 10.1002/sia.3178
Journal Paper B16-Test Beamline
Intragranular lattice misorientation mapping by synchrotron X-ray micro-beams: Laue vs energy-resolved Laue vs monochromatic reciprocal space analysis International Journal Of Modern Physics B, 24 Jan 2010 DOI: 10.1142/S0217979210064216
Journal Paper B16-Test Beamline
- L. Alianelli, K. J. S. Sawhney, A. Malik, O. J. L. Fox, P. W. May, R. Stevens, I. M. Loader, M. C. Wilson, "A planar refractive x-ray lens made of nanocrystalline diamond", Journal Of Applied Physics, 108 (12), 123107 (2010), DOI: 10.1063/1.3517060
- [Conference Paper] Eva Gimenez-Navarro, Rafael Ballabriga, Michael Campbell, Ian Horswell, Igor Dolbnya, Xavier Llopart-Cudie, Julien Marchal, Kawal Sawhney, Nicola Tartoni, Daniel Turecek, "Evaluation of the radiation hardness and Charge Summing Mode of a Medipix3-based detector with synchrotron radiation" (2010), DOI: 10.1109/NSSMIC.2010.5874120
- Xu Song, Felix Hofmann, Alexander M. Korsunsky, "Dislocation-based plasticity model and micro-beam Laue diffraction analysis of polycrystalline Ni foil: A forward prediction", Philosophical Magazine, 90 (30), 3999 - 4011 (2010), DOI: 10.1080/14786435.2010.502149
- [Conference Paper] Alexander Korsunsky, Brian Abbey, Felix Hofmann, Steve Collins, Mengyin Xie, Xu Song, Igor Dolbnya, "Micro-scale characterization of deformation and distortion in ductile (poly)crystals by synchrotron X-ray beams" (2010), DOI: 10.1017/S2044820110000031
- [Conference Paper] Kawal Sawhney, Simon Alcock, Riccardo Signorato, "A novel adaptive bimorph focusing mirror and wavefront corrector with sub-nanometre dynamical figure control" (2010), DOI: 10.1117/12.861593
- [Conference Paper] U. Wagner, S. Dhesi, K. Sawhney, M. A. Macdonald, I. B. Poole, F. M. Quinn, "A versatile multilayer polarimeter for the soft X‐ray region" (2010), DOI: 10.1063/1.3463328
- [Conference Paper] Kawal Sawhney, Igor Dolbnya, Manoj Tiwari, Lucia Alianelli, Stewart Scott, Geoff Preece, Ulrik Pedersen, Rob Walton, "A Test beamline on Diamond Light Source" (2010), DOI: 10.1063/1.3463220
- [Conference Paper] E. N. Gimenez-Navarro, J. Marchal, K. J. S. Sawhney, L. Alianelli, M. Lozano, Giulio Pellegrini, C. Fleta, V. O'Shea, R. Bates, C. Parkes, A. Mac Raighne, D. Maneuski, N. Tartoni, "3D Medipix2 detector characterization with a micro-focused X-ray beam" (2010), DOI: 10.1016/j.nima.2010.06.140
- Albrecht Kyrieleis, Valeriy Titarenko, Thomas Connolley, Mark Ibison, Philip Withers, "Region-of-interest tomography using filtered backprojection: assessing the practical limits", Journal Of Microscopy (2010), DOI: 10.1111/j.1365-2818.2010.03408.x
- Scilla Roncallo, Omeed Karimi, Keith D. Rogers, John M. Gregoire, David W. Lane, Jonathan J. Scragg, Salman A. Ansari, "High throughput X-ray diffraction analysis of combinatorial polycrystalline thin film libraries", Analytical Chemistry, 82 (11), 45644569 (2010), DOI: 10.1021/ac100572h
- [Conference Paper] Prashant Potnis, John Huber, Felix Hofmann, Alexander Korsunsky, John P. Sutter, Brian Abbey, "Mapping of domain structure in Barium Titanate single crystals by synchrotron X-ray topography" (2010), DOI: 10.1117/12.845837
- S. Almaviva, M. Marinelli, E. Milani, G. Prestopino, A. Tucciarone, C. Verona, G. Verona-Rinati, M. Angelone, M. Pillon, I. Dolbnya, K. Sawhney, N. Tartoni, "Chemical vapor deposition diamond based multilayered radiation detector: Physical analysis of detection properties", Journal Of Applied Physics, 107 (1), 014522 (2010), DOI: 10.1063/1.3275501
- M. K. Tiwari, K. J. S. Sawhney, "Structural characterization of thin layered materials using x-ray standing wave enhanced elastic and inelastic scattering measurements", Journal Of Physics: Condensed Matter, 22 (17), 175003 (2010), DOI: 10.1088/0953-8984/22/17/175003
- David Pennicard, Julien Marchal, Celeste Fleta, Giulio Pellegrini, Manuel Lozano, Christopher Parkes, Damien Barnett, Nicola Tartoni, Igor Dolbnya, Kawal Sawhney, Richard Bates, Val O'Shea, Victoria Wright, "Synchrotron tests of a 3D Medipix2 X-ray detector", Ieee Transactions On Nuclear Science, 57 (1), 387-394 (2010), DOI: 10.1109/TNS.2009.2037746
- Manoj Tiwari, Kawal Sawhney, G Lodha, "Multilayer mirror as a substrate for total reflection X-ray fluorescence spectrometry", Spectrochimica Acta Part B: Atomic Spectroscopy (2010), DOI: 10.1016/j.sab.2010.02.011
- M. K. Tiwari, L. Alianelli, I. P. Dolbnya, K. J. S. Sawhney, "Application of kinoform lens for X-ray reflectivity analysis", Journal Of Synchrotron Radiation, 17 (2), 237-242 (2010), DOI: 10.1107/S0909049509055009
- M. K. Tiwari, K. J. S. Sawhney, G. S. Lodha, "Characterization of trace embedded impurities in thin multilayer structures using synchrotron X-ray standing waves", Surface And Interface Analysis, 42 (2), 110-116 (2010), DOI: 10.1002/sia.3178
- Felix Hofmann, Brian Abbey, Xu Song, Igor Dolbnya, Alexander Korsunsky, "Intragranular lattice misorientation mapping by synchrotron X-ray micro-beams: Laue vs energy-resolved Laue vs monochromatic reciprocal space analysis", International Journal Of Modern Physics B, 24 (2010), DOI: 10.1142/S0217979210064216
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