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Imaging and Microscopy
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In This Section

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Instruments by Science Group

Macromolecular
Crystallography
Soft Condensed
Matter
Imaging and
Microscopy
Biological
Cryo-Imaging
Magnetic
Materials
Structures and
Surfaces
Crystallography
Spectroscopy

I14 Contact

I14 Control room:
Tel: +44 (0) 1235 778570

Principal Beamline Scientist: 
Majid Kazemian
Email: [email protected]
Tel: +44 (0) 1235 778222

Science Group Leader

Julia Parker

Email: [email protected]
Tel: +44 (0)1235 778924

I14 Hard X-ray Nanoprobe

Status: Operational

Beamsize: 50nm x 50nm
Energy: 5 - 20 keV

XAS: X-ray Absorption Spectroscopy XRF: X-ray Fluorescence Imaging X-ray Diffraction nXRD: nano X-ray Diffraction Ptychography Spectroscopy PCI: Phase Contrast Imaging Tomography Microscopy nSpectroscopy: nano Spectroscopy XANES: X-ray Absorption Near Edge Structure
  1. Instruments
  2. Imaging and Microscopy
  3. I14
  4. I14 beamtime and access
  5. Before your beamtime
  6. Sample requirements

Sample requirements

Sample Preparation

Sample preparation is key to the success of a nanoprobe experiment. We suggest you discuss the sample preparation and mounting with your local contact before your experiment. Below are some details of our usual sample holders to give an idea of the size and shape of the samples we can handle. Larger or more complex samples are possible but will require considerable input from your local contact.

Silicon Nitride or Silicon Membranes

Image Silicon Nitride or Silicon Membranes

I14 sample holders are designed to take standard silicon nitride membranes in the following sizes

5    x  5 mm Frame with 3 mm window

Typical window thickness ranges from 200nm - 1um with the thicker windows being slightly more robust.

The beamline can supply standard membranes for testing on request. A variety of silicon nitride membrane options are available from commercial suppliers with designs and options to suit different applications. 

Please contact the beamline team to discuss any specific requirements before your experiment and sample preparation.

Silicon Nitride Membrane suppliers

www.silson.com

www.norcada.com/

Kapton MicroMounts

Powder samples can be mounted on kapton MicroMounts or MicroLoops which can be purchased from MiTeGen. 

The standard MicroLoops used at the beamline have aperature size of 50 μm and pin length of 25 mm (product code M5-L25-50).

 

TEM grids

Image TEM grids

I14 sample holders are designed to take 3mm TEM grids.

Both full and half (e.g. omniprobe) grids can be mounted.

The thickness of the grids varies and ring spacers are available at the beamline to aid mounting if required.

For XRF mapping consideration should be given to the grid material.  While copper is the most common grid material, nickel, gold or aluminium are also avaiable which may be more beneficial depending on how your sample is mounted on the grid and the elements of interest to you.

TEM grid suppliers:

www.agarscientific.com/tem/grids-agar.html

https://www.tedpella.com/grids_html/grids.aspx

https://emresolutions.com/

 

Tomography dowel pins

Samples for tomography can be prepared using dowel pins or insect pins. Samples are glued on top of the stainless steel pin and cut down to desired size (< 20 μm) by FIB-SEM. Insect Pins can be purchased from Agar Scientific. Dowel pins can be purchased from Accu. The tomography holder can accomodate 1 mm in diameter and 8 mm in length pins.

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