Instruments
RIXS: Resonant Inelastic X-ray Scattering
Resonant Inelastic X-ray Scattering (RIXS) is a combination of X-ray Absorption Spectroscopy (XAS) and X-ray Emission Spectroscopy (XES), where both the incident and emitted energies are scanned. From the scans a map is obtained, showing the XAS and XES data as well as EXAFS. It is often used in the determination of the transfer energy (the difference between the incident energy and the emitted energy).
Relevant Instrument(s)
I20 LOLA: Versatile X-ray Spectroscopy
I20 now covers two very distinctive modes of operation: X-ray Absorption Spectroscopy (XAS) on challenging samples, X-ray Emission Spectroscopy (XES). The beamline is equipped with a wiggler for the scanning branchline (I20-scanning). The Energy Dispersive branch has been closed.
More informationEnergy: I20-Scanning: design range of 4 - 34 keV; currently operating between 4.5 -20 keV
I21 Inelastic X-ray Scattering
I21 is a dedicated Resonant Inelastic X-ray Scattering (RIXS) beamline that provides a highly monochromatised, focused and tunable X-ray beam onto materials, while detecting and energy-analysing scattered X-rays using a spatially-resolved two-dimensional detector.
More information