Resonant Inelastic X-ray Scattering (RIXS) is a combination of X-ray Absorption Spectroscopy (XAS) and X-ray Emission Spectroscopy (XES), where both the incident and emitted energies are scanned. From the scans a map is obtained, showing the XAS and XES data as well as EXAFS. It is often used in the determination of the transfer energy (the difference between the incident energy and the emitted energy).
I20 covers three very distinctive modes of operation: X-ray Absorption Spectroscopy (XAS) on challenging samples, X-ray Emission Spectroscopy (XES), and Energy Dispersive EXAFS (EDE). The beamline is equipped with two wigglers in the same straight section, one for the scanning branchline (I20-scanning) and the other for the dispersive branch (I20-EDE).
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I21 will be a dedicated Resonant Inelastic X-ray Scattering (RIXS) beamline that will provide a highly monochromatised, focused and tunable X-ray beam onto materials, while detecting and energy-analysing scattered X-rays using a spatially-resolved two-dimensional detector.
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