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Magnetic Materials
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  • Magnetic Materials
  • I06
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In This Section

Sub Navigation
  • Beamline Guide
  • X-ray Photoemission Electron Microscope (I06)
    • Instrument Specifications
    • Sample Specifications
    • PEEM Sample Environments
  • Branchline (I06-1)
  • LaserPEEM Offline Facility (I06-2)
  • Sample Characterisation
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  • Access to I06
  • Manuals and Instructions
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Instruments by Science Group

Macromolecular
Crystallography
Soft Condensed
Matter
Imaging and
Microscopy
Biological
Cryo-Imaging
Magnetic
Materials
Structures and
Surfaces
Crystallography
Spectroscopy

I06 Contact

Beamline Phone Number:
+44 (0) 1235 778709

Principal Beamline Scientist:
Larissa Ishibe-Veiga

Tel: +44 (0) 1235 778869
E-mail: [email protected]

More

I06 Nanoscience

Status: Operational

Energy: First harmonic circular: 106 - 1300 eV | Linear horizontal: 80 - 2100 eV | Linear vertical: 130 - 1500 eV

XAS: X-ray Absorption Spectroscopy XMCD: X-ray Magnetic Circular Dichroism XMLD: X-Ray Magnetic Linear Dichroism SXD: Soft X-ray Diffraction Spectroscopy PEEM: PhotoEmission Electron Microscopy Imaging
  1. Instruments
  2. Magnetic Materials
  3. I06
  4. X-ray Photoemission Electron Microscope (I06)
  5. PEEM Sample Environments

PEEM Sample Environments

TEMPERATURE DEPENDENT MEASUREMENTS

Samples can be:

  • cooled with liquid Nitrogen down to ~ 100 K with dedicated cartridges equipped with Pt100 temperature sensors and allowing internal temperature regulation loop.
  • heated radiatively up to ~1000 K or  flashed with e-beam up to ~1900 K for short periods. The temperature is measured either with a W/Re type C thermocouple spot-welded and in thermal contact with the rear face of the sample or with an optical pyrometer in the preparation chamber.

Real time imaging remains possible from ~100 K to 1000 K.

IN SITU AND IN OPERANDO MEASUREMENTS

The microscope operates using an high 15-20kV accelerating voltage applied between the sample surface and the first immersion lens at few mm distance. Any piece of electronic in contact with the sample cartridge must be located inside the high voltage (HV) rack and particular care must be taken to protect it from electrical discharges coming from the sample. Any additional equipment not already supplied by the beamline must be discussed with beamline staff well in advance.

The following in operando measurements can be performed, while imaging with PEEM:

  • in-plane magnetic fields: < 40 mT in pulsed mode (no imaging) and < 2 mT in-operando
  • out-of-plane magnetic fields: < 80 mT in pulsed mode and < 20mT in-operando
  • out-of-plane electric fields produced by application of a bias between the sample surface and rear face (+/- 400 V).

Due to strong accelerating voltages, HV electrical sparks may occur at the surface and destroy samples. To limit their occurence on samples with patterned electrodes and sensitive channels, current pulses must be applied with the accelerating voltage switched off.

CARTRIDGES FOR IN SITU AND OPERANDO MEASUREMENTS

Cartridges for in-situ and in-operando measurements are listed below:

  • Magnetic Fields
  • Electric Fields Low Temperature
  • Current Pulsing
  • Omicron plate adaptor
  • More

Magnetic Field Cartridges

  • Magnetic field cartridges

Uniaxial in-plane (<40mT in pulsed mode) and out-of-plane (<80mT in pulsed mode) magnetic fields can be applied. Please contact beamlime staff for more information.

magnetic fields

In-plane uniaxial (left) and out-of-plane, PCB compatible (right) magnetic field cartridges.

Electric Field/Low Temperature Cartridges

  • Out-of-plane electric fields

The copper cartridges are optimised for cryogenic temperatures and mild annealings (100K < T < 400K). The pt100 thermoresistor accurately measure the sample temperature. The sample is mounted on an electrode that allows the application of out-of-plane electric fields (+/- 400V).

electric field

Out-of-plane electric field cartridge with temperature control (100K < T < 400K).

Current Pulsing Cartridges

  • Current pulsing cartridges with wire bonded electrical contacts.

The standard version requires the sample to be glued on the cartridge and has four contact pillars as micro-bond contact pads (figure 1, left panel).The Printed Circuit Board (PCB) version, carries a PCB that can be separately used to micro-bond the sample.Both the standard and the PCB carriers allow 4 contacts to be made.

The tempearature-pulsing PCB cartridge has 2 contacts available for the sample. Temperature reading and control using a pt100 thermal sensor and a heating filament is possible in the range of 100-600K.

pulsing cartridges
(a) Standard pulsing cartridge with 4 contact pillars. (b) Printed Circuit Board (PCB) cartridge carrier with 4 contacts. (c) PCB cartridge adapter with temperature control and 2 contact pad available

Omicron plate adaptor

  • Samples mounted on Omicron flagplate (such as used for in-situ STM imaging) can be measured in the PEEM, using an cartridge adaptor.

omicron adaptor

PEEM cartriges with Omicron plate adaptor.

Additional Cartridges

  • Cartridges combining different excitations are possible (details must be discussed with beamline staff).

ANCILLARY ELECTRONICS

In situ and in operando measurements are supported by full remote control of the following components:

  • Synapse Multiplexing unit (4 channels)
  • Keithley 2461 sourcemeter (I-V characteristics/hysteresis)
  • Avtec pulse generator (10ns rise time)
  • Two channel bipolar power supply for uniaxial and vectorial magnetic field cartridges
  • Temperature controller for low temperature cartridges with bipolar high voltage source (+/- 400 V) 

SAMPLE TRANSFER CAPABILITIES

  • UHV Ferrovac suitcase

ferrovac

UHV suitcase (compatible with Omicron plates).

 

  • Inert gas suitcase (transfer from glovebox)

inert gas

Inert gas suitcase (compatible with Elmitec cartridges). The suitcase can be fitted inside a glovebox without  the need of a docking port.

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