Principal Beamline Scientist:
Fred Mosselmans
Tel: +44 (0) 1235 778568
E-mail: fred.mosselmans@diamond.ac.uk
Email: sofia.diaz-moreno@diamond.ac.uk
Tel: +44 (0) 1235 778158
26 November 2014
I20-1 is now I20-scanning
I20-2 is now I20-EDE
Please reference the beamline and the branchlines with these new names in your publications.
The principle of the Energy Dispersive EXAFS (EDE) beamline is based on the diffraction of non monochromatic X-rays by a bent crystal (polychromator crystal). The polychromatic beam is focused onto the sample and then diverges towards a position sensitive detector where beam position is correlated to energy.
The dispersive configuration of XAS has two main advantages that make it scientifically attractive. First, the whole X-ray absorption spectrum is collected simultaneously which makes the technique especially useful for the study of fast processes. Second, the size of the focussed beam at the sample position is small and very stable due to the fact that no movement of optical elements is required to collect the spectral data.
| Energy range | Si(111): 6 - 14 keV Si (311): 7 - 26 keV |
| Focusing distance (q) | 1.0 and 1.2 m |
| Energy bandpass | ≥ 10% at all energies |
| Flux at 10 keV (ph/s) in 10% bandpass | > 1012 |
| Minimum spot size at sample (µm) | HxV = 30 x 100 |
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