Beamline Phone Number:
+44 (0) 1235 778712
Principal Beamline Scientist:
Konstantin Ignatyev
Tel: +44 (0) 1235 778600
E-mail: [email protected]
Email: [email protected]
Tel: +44 (0) 1235 778158
| Spatial resolution | 2 x 2 µm |
| Energy range (keV) | 2.05 - 20.5 |
| Core energy range (keV) | 5 - 15 |
| Energy resolution (Δ E/E) | Si 111: 1.4 x 10-4 |
| Energy stability (eV) | +/- 0.05 per day |
| Full beam size Flux @ 10 keV at sample (ph/s) | 2 x 1012 |
| Beam size at sample (µm) at full flux | 7 (H) x 1.8 (V) |
| Minimum beam size at sample (µm) | 2 (H) x 1.8 (V) |
| Beam divergence at sample (mrad) (FWHM) | 3 (H) x 2 (V) |
| Beam position stability at sample | <1 µm per day |
• I18 is based on three mirrors and a double crystal monochromator.
• Rh-coated Silicon toroidal mirror sits 25 m from the source focusing the beam horizontally and collimating verticaly 37.5 m from the source.
• A fixed-exit monochromator with one set of Si(111) crystals sits 27.7 m from the source covering the energy range 2.05 – 20.5 keV at an energy resolution of 1.4 x 10-4 (core range 5 - 15 keV).
• For higher resolution but less flux the Si(333) reflection may be used 6 - 20 keV.
• There is also a pair of plane mirrors for harmonic rejection at low energies ( <4 keV) using either Rh or Ni stripe.
• Mechanical Kirkpatrick-Baez focusing mirrors with Si and Rh stripes at the end of the beamline. These are non-chromatic, ideal for energy scanning applications like EXAFS (extended X-ray absorption fine structure) operating over the full beamline energy range.
• Typical focus 2 - 5 (V) x 2 -5 (H) micron spot size. Can be defocused up 100 microns. Alternatively can be removed from the beam path for bulk XAS with a spot size ca. 400 microns.
| Insertion device | 2 m U27 in-vacuum undulator |
| Nominal magnet length (m) | 2 |
| Nominal magnet gap (mm) | 7 |
| Magnet period (mm) | 27 |
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