A novel instrument for generating angular increments of 1 nanoradian Simon G. Alcock, Alex Bugnar, Ioana Nistea, Kawal Sawhney, Stewart Scott, Michael Hillman, Jamie Grindrod, Iain Johnson
Review Of Scientific Instruments, 86 Dec 2015 DOI: 10.1063/1.4937352 Aberration-free short focal length x-ray lenses Lucia Alianelli, Manuel Sánchez Del Rio, Oliver J . L. Fox, Katarzyna Korwin-Mikke
Optics Letters, 40 (23) Nov 2015 DOI: 10.1364/OL.40.005586 Lens-term- and edge-effect in X-ray grating interferometry Johannes Wolf, Jonathan I. Sperl, Florian Schaff, Markus Schüttler, Andre Yaroshenko, Irene Zanette, Julia Herzen, Franz Pfeiffer
Biomedical Optics Express, 6 (12) Nov 2015 DOI: 10.1364/BOE.6.004812 Optimization of propagation-based phase-contrast imaging at a laboratory setup Pidassa M. Bidola, Irene Zanette, Klaus Achterhold, Christian Holzner, Franz Pfeiffer
Optics Express, 23 (23) Nov 2015 DOI: 10.1364/OE.23.030000 In vacuo X-ray data collection from graphene-wrapped protein crystals Anna J. Warren, Adam D. Crawshaw, Jose Trincao, Pierre Aller, Simon Alcock, Ioana Nistea, Paula S. Salgado, Gwyndaf Evans
Acta Crystallographica Section D Biological Crystallography, 71 (10) Oct 2015 DOI: 10.1107/S1399004715014194 Two-dimensional transverse coherence measurement of hard-x-ray beams using near-field speckle Yogesh Kashyap, Hongchang Wang, Kawal Sawhney
Physical Review A, 92 (3) Sept 2015 DOI: 10.1103/PhysRevA.92.033842 Speckle based X-ray wavefront sensing with nanoradian angular sensitivity Hongchang Wang, Yogesh Kashyap, Kawal Sawhney
Optics Express, 23 (18) Aug 2015 DOI: 10.1364/OE.23.023310 Development of polycapillary x-ray optics for synchrotron spectroscopy Mark A. Popecki, Daniel Bennis, Bernhard Adams, Aileen O'Mahony, Christopher A. Craven, Michael R. Foley, Michael J. Minot, Joseph M. Renaud, Justin L. Bond, Michael E. Stochaj, Klaus Attenkofer, Eli Stavitski
Spie, 9588 Aug 2015 DOI: 10.1117/12.2188687 Novel opportunities for sub-meV inelastic X-ray scattering at high-repetition rate self-seeded X-ray free-electron lasers Oleg Chubar, Vitali Kocharyan, Evgeni Saldin, Svitozar Serkez, Yuri Shvyd'Ko, John Sutter
Aug 2015 DOI: 10.18429/JACoW-FEL2015-MOP086 Two-dimensional in situ metrology of X-ray mirrors using the speckle scanning technique Hongchang Wang, Yogesh Kashyap, David Laundy, Kawal Sawhney
Journal Of Synchrotron Radiation, 22 Jul 2015 DOI: 10.1107/S1600577515006657 Characterization of near-field ptychography Richard M. Clare, Marco Stockmar, Martin Dierolf, Irene Zanette, Franz Pfeiffer
Optics Express, 23 Jul 2015 DOI: 10.1364/OE.23.019728 High reflectance Cr/C multilayer at 250eV for soft X-ray polarimetry Mingwu Wen, Li Jiang, Zhong Zhang, Qiushi Huang, Zhanshan Wang, Rui She, Hua Feng, Hongchang Wang
Thin Solid Films, June 2015 DOI: 10.1016/j.tsf.2015.06.005 At-wavelength metrology of X-ray adaptive mirrors at Diamond Light Source Hongchang Wang, Yogesh Kashyap, John Sutter, Kawal Sawhney
June 2015 DOI: 10.1364/AOMS.2015.AOTh2C.2 Theoretical analysis of the background intensity distribution in X-ray Birefringence Imaging using synchrotron bending-magnet radiation John Sutter, Igor Dolbnya, Steve Collins, Kenneth D. M. Harris, Gregory Edwards-Gau, Benjamin Palmer
Journal Of Applied Physics, 117 (16) Apr 2015 DOI: 10.1063/1.4918925 Periodic Co/C, Cr/C, and CoCr/C soft X-ray multilayers prepared by N reactive sputtering Mingwu Mingwu, Li Jiang, Zhong Zhang, Qiushi Huang, Zhanshan Wang, Hongchang Wang, Mingqi Cui, Rongqing Yi
Spie, 9510 Apr 2015 DOI: 10.1117/12.2178633 Hard-X-ray directional dark-field imaging using the speckle scanning technique Hongchang Wang, Yogesh Kashyap, Kawal Sawhney
Physical Review Letters, 114 (10) Mar 2015 DOI: 10.1103/PhysRevLett.114.103901 X-ray phase contrast tomography by tracking near field speckle Hongchang Wang, Sebastien Berujon, Julia Herzen, Robert Atwood, David Laundy, Alexander Hipp, Kawal Sawhney
Scientific Reports, 5 Mar 2015 DOI: 10.1038/srep08762 Advanced X-ray imaging using sandpaper Diamond Light Source
Mar 2015 Science Highlight B16-Test Beamline
Advanced in situ metrology for x-ray beam shaping with super precision Hongchang Wang, John Sutter, Kawal Sawhney
Optics Express, 23 (2) Jan 2015 DOI: 10.1364/OE.23.001605 X-ray birefringence imaging of materials with anisotropic molecular dynamics Benjamin Palmer, Gregory Edwards-Gau, Benson M. Kariuki, Kenneth D. M. Harris, Igor Dolbnya, Stephen P. Collins, John P. Sutter
The Journal Of Physical Chemistry Letters, 6 (3) Jan 2015 DOI: 10.1021/jz502652n Surface profiling of X-ray mirrors for shaping focused beams David Laundy, Lucia Alianelli, John Sutter, Gwyndaf Evans, Kawal Sawhney
Optics Express, 23 Jan 2015 DOI: 10.1364/OE.23.001576