Ni layer thickness dependence of the interface structures for Ti/Ni/Ti trilayer studied by X-ray standing waves Wenbin Li, Jingtao Zhu, Haochuan Li, Zhong Zhang, Xiaoying Ma, Xiaoyue Yang, Hongchang Wang, Zhanshan Wang
Acs Applied Materials & Interfaces, 5 (2) Dec 2012 DOI: 10.1021/am3024614 X-ray multimodal imaging using a random-phase object Sebastien Berujon, Hongchang Wang, Kawal Sawhney
Physical Review A, 86 (6) Dec 2012 DOI: 10.1103/PhysRevA.86.063813 Bimorph mirrors: The good, the bad, and the ugly Simon G. Alcock, John Sutter, Kawal Sawhney, Dave Hall, Katherine Mcauley, Thomas Sorensen
Nuclear Instruments And Methods In Physics Research Section A: Accelerators, Spectrometers, Detectors And Associated Equipment, 710 Nov 2012 DOI: 10.1016/j.nima.2012.10.135 Measurement and analysis of active synchrotron mirrors under operating conditions John P. Sutter, Simon Alcock, Kawal Sawhney
Nuclear Instruments And Methods In Physics Research Section A: Accelerators, Spectrometers, Detectors And Associated Equipment, 710 Nov 2012 DOI: 10.1016/j.nima.2012.10.115 In situ beamline analysis and correction of active optics John Sutter, Simon Alcock, Kawal Sawhney
Journal Of Synchrotron Radiation, 19 (6) Nov 2012 DOI: 10.1107/S090904951203662X Journal Paper I02-Macromolecular Crystallography I03-Macromolecular Crystallography I04-Macromolecular Crystallography I15-Extreme Conditions I19-Small Molecule Single Crystal Diffraction I20-Scanning-X-ray spectroscopy (XAS/XES) I22-Small angle scattering & Diffraction Complete polarization analysis of an APPLE II undulator using a soft X-ray polarimeter Hongchang Wang, Peter Bencok, Paul Steadman, Emily Longhi, Jingtao Zhu, Zhanshan Wang
Journal Of Synchrotron Radiation, 19 (6) Nov 2012 DOI: 10.1107/S0909049512034851 Grating-based at-wavelength metrology of hard x-ray reflective optics Sebastien Berujon, Eric Ziegler
Optics Letters, 37 (21) Oct 2012 DOI: 10.1364/OL.37.004464 Ultra-high performance mirror systems for the imaging and coherence beamline I13 at the Diamond Light Source U. H. Wagner, G. Ludbrook, J. Wiatryzk, S. Alcock, C. Rau
Sept 2012 DOI: 10.1063/1.3703334 Shearing interferometer spatial resolution for at-wavelength hard X-ray metrology Sebastien Berujon, Hongchang Wang, Eric Ziegler, Kawal Sawhney
Aip Conference Proceedings, 1466 Aug 2012 DOI: 10.1063/1.4742295 Characterization of a one dimensional focusing compound refractive lens using the rotating shearing interferometer technique Hongchang Wang, Sebastien Berujon, Kawal Sawhney
Aip Conference Proceedings, 1466 Aug 2012 DOI: 10.1063/1.4742296 Complete polarization analysis of high energy soft x-rays by combining a multilayer phase retarder with crystal analyzer H. Wang, F. Maccherozzi, S. S. Dhesi, K. J. S. Sawhney
Journal Of Applied Physics, 111 (12) June 2012 DOI: 10.1063/1.4730899 X-ray submicrometer phase contrast imaging with a Fresnel zone plate and a two dimensional grating interferometer S. Berujon, H. Wang, I. Pape, S. Rutishauser, C. David, K. Sawhney
Optics Letters, 37 May 2012 DOI: 10.1364/OL.37.001622 Geometrical factor correction in grazing incident x-ray fluorescence experiment Wenbin Li, Jingtao Zhu, Xiaoying Ma, Haochuan Li, Hongchang Wang, Kawal J. S. Sawhney, Zhanshan Wang
Review Of Scientific Instruments, 83 (5) May 2012 DOI: 10.1063/1.4722495 Aspherical lens shapes for focusing synchrotron beams Manuel Sanchez Del Rio, Lucia Alianelli
Journal Of Synchrotron Radiation, 19 May 2012 DOI: 10.1107/S0909049512003020 Implementation of a beam deflection system for studies of liquid interfaces on beamline I07 at Diamond Tom Arnold, Chris Nicklin, Jonathan Rawle, Trevor Bates, Brian Nutter, Gary Mcintyre, Martin Burt, John Sutter
Journal Of Synchrotron Radiation, 19 (3) May 2012 DOI: 10.1107/S0909049512009272 Characterisation of microfocused beam for synchrotron powder diffraction using a new X-ray camera C. Thomas, J. Potter, C. C. Tang, A. R. Lennie
Journal Of Instrumentation, 7 Jan 2012 DOI: 10.1088/1748-0221/7/01/P01014