RCaH equipment can also be used by Diamond users and Diamond Staff, for more information please visit:
http://www.rc-harwell.ac.uk/diamond
Equipment available:
http://www.rc-harwell.ac.uk/equipment.html
Ellipsometry can be used to determine sample thickness, complex refractive index or dielectric function tensor by measuring the change of polarization of light on reflection or transmission.
The sample must be composed of a small number of discrete, well-defined layers that are optically homogeneous and isotropic.
Diamond Light Source is the UK's national synchrotron science facility, located at the Harwell Science and Innovation Campus in Oxfordshire.
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