Offline Equipment

Science Group: Surfaces & Interfaces
Comments:

Ellipsometry can be used to determine sample thickness, complex refractive index or dielectric function tensor by measuring the change of polarization of light on reflection or transmission.

The sample must be composed of a small number of discrete, well-defined layers that are optically homogeneous and isotropic.

• Single wavelength ellipsometry (wavelength 658 nm) available
• Multi-wavelength (365-1000nm) measurements available using Xenon arc lamp and filter wheel
• Motorised goniometer (angle of incidence 38-90 degrees)
• PC driven acquisition system
• Can be set up as a Brewster Angle Microscope
• Field of View 400 microns
• Lateral resolution 2 microns

Booking

Non Proprietary Use

• Use as part of approved beamtime: see your local contact
• Not part of approved beamtime: contact laboratory coordinator

Proprietary Use

• Contact the Industrial Liaison Office