RCaH equipment can also be used by Diamond users and Diamond Staff, for more information please visit:
Ellipsometry can be used to determine sample thickness, complex refractive index or dielectric function tensor by measuring the change of polarization of light on reflection or transmission.
The sample must be composed of a small number of discrete, well-defined layers that are optically homogeneous and isotropic.
Diamond Light Source is the UK's national synchrotron science facility, located at the Harwell Science and Innovation Campus in Oxfordshire.
Copyright © 2022 Diamond Light Source
Diamond Light Source Ltd
Harwell Science & Innovation Campus
Diamond Light Source® and the Diamond logo are registered trademarks of Diamond Light Source Ltd
Registered in England and Wales at Diamond House, Harwell Science and Innovation Campus, Didcot, Oxfordshire, OX11 0DE, United Kingdom. Company number: 4375679. VAT number: 287 461 957. Economic Operators Registration and Identification (EORI) number: GB287461957003.