Beamline Phone Number:
+44 (0) 1235 778300
Principal Beamline Scientist:
Tien-Lin Lee
Tel: +44 (0) 1235 778947
E-mail: tien-lin.lee@diamond.ac.uk
Email: chris.nicklin@diamond.ac.uk
Tel: +44 (0)1235 778523
| X-ray | December 2012 | February 2013 | March 2013 | |
| Radiation sources | Hard | 2 m in-vacuum U27 (gapmin = 5.1 mm) | ||
| Soft | 1 m in-vacuum HU56 (gapmin = 21 mm) | |||
| Energy ranges and polarizations (for EH2) | Hard | 2.1 - 18 keV | ||
| Soft | Linear horizontal: 230 - 800 eV | Horizontal: 230 - 2000 eV | ||
| Vertical: 500 - 2000 eV | ||||
| Helical: 400 - 1300 eV | ||||
| Mono-chromators | Hard | Si(111) double-crystal monochromator | ||
| Secondary monochromator using back-reflecting Si(111), Si(011) and Si(001) channel cuts | ||||
| Soft | Plane grating monochromator | |||
| 300 line/mm grating | 300, 400 and 800 line/mm gratings | |||
| Beam sizes at sample | Hard & Soft | Focused: 40 (H) x 20 (V) µm2 defocused: 300 (H) x 300 (V) µm2 | ||
| Experimental hutches/cabins | EH2 | |||
| End-stations | A UHV surface science system for XPS, NAXAFS, XSW and PhD | |||
| Sample manipulator | 5 axes: X, Y, Z, polar (0 - 360°) and azimuth (0 - 360°) Omicron type sample plates | |||
| In-situ surface preparation | | Heating (e-beam or radiative): upto 1500 K (open-loop control) | ||
| Cooling: < 50 K with LHe or < 100 K with LN2 (open-loop control) | ||||
| Ion sputtering | ||||
| Physical vapor depostion (e-beam evaporator, K-cell, or users' evaporators) | ||||
| Gas dosing | ||||
| In-situ surface characterization without SR | LEED and UPS (He lamp with monochromator) | |||
| Detectors | VG Scienta EW4000 HAXPES with a 70 frame/sec CCD camera Transmission and angular modes 40 mm working distance Ek upto 10 kV Analyzer-incdent beam angle = 60° or 90° | |||
| | Sample drain currents | |||
| Reflectivity screen for normal incidence XSW | ||||
| Detectors-beamline control interface | ||||
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