Beamline Phone Number:
+44 (0) 1235 778651
Principal Beamline Scientist:
Cephise Cacho
Tel: +44 (0) 1235 778290
E-mail: [email protected]
Email: [email protected]
Tel: +44 (0)1235 778290
Access to the beamline is primarily through the twice-yearly peer review panel system, however there is also a Rapid Access process. Potential users may contact the I05 beamline team to discuss their proposal in detail.
Equipment or Component | Availability | Comments |
Energy range 18 – 240 eV | Available | |
Optimised Energy Resolution 20 – 80 eV | Available | 0.9 meV at 20 eV 3.6 meV at 60 eV |
Resolving power > 20’000 | Available | |
Linear Horizontal polarisation | Available | |
Linear Vertical polarisation | Available | |
Circular left or right polarisation | Available |
Scienta R4000 hemispherical electron energy analyser with +/- 15º angle multiplexing lens. | Available | Analyser entrance slit vertical, along main rotation axis of manipulator for Fermi surface maps. |
Motorised six-degree-of-freedom sample cryogenic manipulator | Available | tilt = -30, +40 deg azimuth = -120, +120 deg |
Variable temperature 10 – 350 K | Available | Tested 6 K - 336 K with He flow running. |
Sample check and orientation by LEED | Available | |
Ultrahigh vacuum sample transfers | Available | |
Fast entry load lock | Available | |
Sample transfers with UHV vacuum suitcase | Pending full commissioning | Port for compatible vacuum suitcase required on user sample growth system. |
Sample preparation by top-post cleavage | Available | See below for sample dimensions. Usually low temperature cleavage. |
Sample preparation by sputter/annealing | Available | Contact BL scientists for sample holder dimensions. |
Flash heating of samples | Available | VG Scienta HPT heater stage. |
Evaporation deposition on sample | Available | Requirements need to be discussed with beamline scientists. |
Scienta DA30 hemispherical electron energy analyser with +/- 15º angle multiplexing lens and +/- 10º deflector lens scanning. |
Available |
Analyser entrance slit vertical |
Sample temperature 40 – 300 K |
Available |
|
Two-axis sample goniometer for adjustment of base direction of sample normal |
Available |
polar = -10/+45° azimuth = -30/30° Note: no tilt axis available. |
Fast entry load lock and ultrahigh vacuum sample transfers |
Available |
|
Sample transfers with UHV vacuum suitcase |
Pending full commissioning |
Port for compatible vacuum suitcase required on user sample growth system. |
Electrical connections to sample, maximum 4 or 5 depending on sample holder | Available | Contact BL scientists for available sample holder with contacts. We now primarily use a standard chip package. |
Sample preparation by top-post cleavage |
Available |
See below for sample dimensions. Usually low temperature cleavage. |
Sample preparation by sputter/annealing |
Available |
Contact BL scientists for sample holder dimensions. |
Flash heating of samples |
Available |
Sample temperature up to 1000°C |
Evaporation deposition on sample |
Available |
Available in preparation or characterization chamber only. Requirements need to be discussed with beamline scientists. |
Optical microscopes | Available | |
Sample holders and top posts for cleavable samples | Available | |
Epoxy glue and curing facilities | Available | |
Sample pre-orientation by Laue diffraction (ex situ) | Not available |
Requirements on sample (top post cleavage preparation):
Drawing of the i05-ARPES sample-holder assembly for top-post cleavage
Please contact Beamline Scientists to discuss cleavability or requests to use non-standard cleavage methods.
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