B18 Contact
Beamline Phone Number:
+44 (0) 1235 778695
Beamline E-mail:
Principal Beamline Scientist:
Diego Gianolio
Tel: +44 (0) 1235 778228
E-mail: [email protected]
Science Group Leader
Email: [email protected]
Tel: +44 (0) 1235 778158
The B18 end station can be sub-divided into a high energy section and a low energy section.
High Energy Section
The in-air section of the table can be used for experiments between 4 and 35 keV approximately. A large and flexible sample space is available, allowing for the installation of sample environments. Please see the dedicated tab for details about the sample environments availalbe at the beamline. User-designed environments can be installed in the beamline after discussion with beamline staff. The footprint available on the table is ca 600mm x 600mm.
Transmission and fluorescence XAS, and XRD measurements are possible in this section.
Low Energy Section
The in-vacuum section can be used for experiments in the lower energy region (ca. 2 to 4 keV). A chamber with controlled atmosphere and different sample manipulators are available. Sample holders are 100 mm length and have capacity to mount multiple samples. Custom-designed manipulators can offer direct transfer from glove box for air sensitive materials or possibility to control temperature through liquid nitrogen cooling.
Total Electron Yield (TEY) and fluorescence measurements are possible in this section.
| Detector | Comments |
|---|---|
| Ionization chambers |
3 ionization chambers mounted in series in the High energy section for measuring incident and transmitted intensities from the sample and transmitted intensity from a reference metal foil. 1 ionization chamber mounted in the low energy section to measure incident intensity on the sample. |
| 4 elements Si drift fluorescence detector ( Vortex ) [2-15 keV] with xspress3 electronics | Can be used for fluorescence mode XAS in the chamber of the low energy section or in the high energy section. More efficient at lower enegies than Ge detector. Saturation limit at ca. 300 kcps per element. |
| 36 elements Ge fluorescence detector [5-35 keV] with xspress2 electronics | Can be used for fluorescence mode XAS in the high energy section. More efficient at higher enegies than Si detector. Saturation limit at ca. 200 kcps per element. |
| Mythen XRD detector | Can be used for simultaneous collection of XRD data with XAFS. Wide angle detector that covers angles 10-70 degrees. |
| Dispersive Emission Spectrometer with Von-Hamos geometry | Can be used to measure XAS spectra in fluorescence mode for sample containing two or more elements with fluorescence lines that cannot be distinguished by solid state detector energy resolution (ca 200eV) or to collect low-resolution dispersive XES. |
A set of metal foils and other reference materials is mounted on a motorised wheel between 2nd and 3rd ion chamber and is maintained under controlled atmosphere. This allows for simultaneous measurements of the sample and a standard of the same element (or in same energy range) to have a constant check of energy calibration during experiment.
The foils available on this wheel include Ti, V, Cr, Mn, Fe, Co, NI, Cu, Zn, Y, Zr, Nb, Mo, Rh, Pd, Ag, Cd, In, Sn, Sb, Ta, W, Pt, Au, Pb.
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