Veeco-Bruker Atomic Force Microscope (AFM)

The Veeco-Bruker atomic force microscope (AFM) is a scanning probe microscope, used for imaging samples and to extract topographic information with nanometre resolution. The AFM can be used to characterize a wide variety of materials and has applications in physics, chemistry, biology and engineering.

Unlike an electron microscope, which provides a two-dimensional image of the sample, the AFM provides a three-dimensional surface profile. In addition, samples viewed by AFM do not require special treatment (such as metal/carbon coatings) and do not typically suffer from charging artifacts. While an electron microscope needs a vacuum environment, an AFM works under ambient conditions. This makes it possible to also study biological macromolecules and organic samples (provided the tip does not disrupt the molecular surface).

Specifications:

• Several modes for investigating different samples and their properties are:
  • Contact Mode - where a tip acts on a spring and surface forces are measured as the tip follows the sample surface, causing the cantilever to flex.
  • Tapping Mode - where the probe oscillates near the resonant frequency of the cantilever to monitor oscillation amplitude and phase of cantilever motion near the surface. Here, contact forces are minimised.
  • Magnetic Force Microscopy (MFM) - a variation of Tapping Mode to investigate magnetic samples using a magnetic coated tip.

• The AFM is mounted on a granite block for isolating vibrations.
• Continuous adjustment of the scan rate is possible.
• Maximum sample size of approximately 1 cm in diameter and a thickness of 2 mm, mounted on 10 mm - 12 mm magnetic pucks.
• No additional sample treatment needed.
• Auto functions
• NanoScope V controller electronics. 
• Optical microscope with 10x objective.

For more information, visit:

https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm.html