Sample environments

Please note:  

Due to a lack of resources, we are currently not capable to prepare cryogenic samples and perform experiments under cryogenic conditions.

Please contact the Principal Beamline Scientist.

The I08-SXM standard quad sample holder as shown here consists of two Au plated Cu precision-engineered pieces.

The lower block is Leica EM-type and inserts in the specimen stage of the end station by a spring clamp mechanism.

The upper piece (sample holder) has four apertures for TEM-type grids or SiN membranes (see below). The sample holder is attached to the sample block by a high precision magnetic kinematic mount mechanism. This simplifies visual inspection with a microscope and identification of regions of interest.

Samples are inserted in the apertures and rigidly hold in place by magnetic clip rings.

I08-SXM supports only TEM-type SiN membranes or Cu/ Au grids. Other types os sample supports might be rejected by BL staff or will cause you a significant loss of beam time due to sample mounting issues.

 Si crystal based membranes (left image) are available in different variants and window sizes. For most of the applications window sizes of <1mm and window thicknesses of <100nm are appropriate.

Also standard TEM grids can be purchased with a great variety including Carbon coating and reference markers. All those types of grids are compatible with I08-SXM including quantifoil grids.C-ring mounts or specific for FIB sections.

Good sample thicknesses are a function of the optical density of the sample, which is in many cases difficult to estimate and to anticipate. Helpful information can be acquired from the CXRO data base. We have good experience in guiding you but sometimes it might be helpful to consider a test sssion to prove the optimum thickness of your samples. Bulk samples with no transmission in our photon energy are not technically feasible.

Unconventional specimen environments for in-stu or in-operando studies are in our vision since the early operation of the BL. Such implementations do require quite an effort of scientific and engineering effort.

For more information, please contact Majid Kazemian.

I08-SXM covering the lower Z-element range is not pre-dominantely suited for imaging and spectromicroscopy of actinides although it has been recently proven that it is possible to perform N-edge sprectromicroscopy on Uranium components.

Any I08-XXM experiment does need the prove that the samples and its enclosures will not contaminate the instrument and harm BL personnel,

• Specimens that cannot be mounted on EM grids or TEM-type Si membranes;
• Specimen with thicknesses not adapted to allow sufficient X-ray transmission signals;
• Application of external magnetic fields;
• Cooling down liquid He temperatures;
• Heating of a specimen.