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Microscope | Main Capabilities | Accelerating Voltages | Operational Status |
---|---|---|---|
Titan Krios I | Cryo-EM, Cryo-ET | 80, 120, 200, 300 kV | Operational since 2015 |
Titan Krios II | Cryo-EM, Cryo-ET | 80, 120, 200, 300 kV | Operational since 2016 |
Titan Krios III | Cryo-EM, Cryo-ET | 80, 120, 200, 300 kV | Operational since 2017 |
Titan Krios IV | Cryo-EM, Cryo-ET | 80, 120, 200, 300 kV | Operational since 2017 |
Titan Krios V | Cryo-EM, Cryo-ET | 80, 120, 200, 300 kV | Operational since 2018 |
Talos Arctica | Cryo-EM, Cryo-ET | 200 kV | Operational since 2016 |
Glacios | Cryo-EM, Cryo-ET | 200 kV | Installed, March 2019 |
Scios | Cryo-SEM, Cryo-FIB | 3 to 30 kV | Operational since 2017 |
Aquilos | Cryo-SEM, Cryo-FIB | 3 to 30 kV | Operational since 2019 |
JEOL ARM200F | Atomic scale STEM imaging, EELS, EDX, electron diffraction | 80, 200 kV | Operational since 2017 |
JEOL ARM300F | Atomic scale TEM and STEM imaging, electron diffraction, 4D-STEM, EDX | 30, 60, 80, 160, 200, 300 kV | Operational since 2017 |
Beamline Name and Number | Main Techniques | Energy / Wavelength Range | Status |
---|---|---|---|
I02-1 - Versatile MX micro (VMXm) | Micro- and nano-focus in vacuum cryo-macromolecular crystallography (VMXm) | 7 - 28 keV | Commissioning |
I02-2 - Versatile MX in situ (VMXi) | In situ microfocus macromolecular crystallography, Serial Synchrotron Crystallography | 10 - 25 keV | Commissioning |
I03 - MX | Macromolecular crystallography (MX), Multiwavelength Anomalous Diffraction (MAD) | 5 - 25 keV | Operational |
I04 - Microfocus MX | MX, MAD | 6 - 18 keV | Operational |
I04-1 - Monochromatic MX | MX, XChem fragment screening | 13.53 keV (fixed wavelength) | Operational |
I05 - ARPES | Angle-Resolved PhotoEmission Spectroscopy (ARPES) and nano-ARPES | 18 - 240 eV; 500 eV | Operational |
I06 - Nanoscience | X-ray Absorption Spectroscopy (XAS), X-ray photoemission microscopy and X-ray magnetic circular and linear dichroism | 80 - 2200 eV | Operational |
I07 - Surface and Interface Diffraction | Surface X-ray diffraction, Grazing Incidence X-ray Diffraction (GIXD), Grazing Incidence Small Angle X-ray Scattering (GISAXS), X-ray Reflectivity (XRR) | 6 - 30 keV | Operational |
B07 - VERSOX: Versatile Soft X-ray | Ambient Pressure XPS and NEXAFS | 250 - 2800 eV | Operational |
NEXAFS and High-Throughput XPS | 50 - 2200 eV | Commissioning | |
I08 - Scanning X-ray Microscopy | Scanning X-ray microscopy, NEXAFS/ XANES, X-ray fluorescence | I08 branch: 250 eV - 4.4 keV | Operational |
J08 - Soft and Tender X-ray Ptychography branch: 250 - 2000 eV | Construction | ||
I09 - Atomic and Electronic Structure of Surfaces and Interfaces | XPS (including HAXPES), X-ray Standing Waves (XSW), Near Edge X-ray Absorption Fine Structure (NEXAFS), Energy-scanned photoelectron diffraction | Hard X-rays: 2.1 - 18+ keV Soft X-rays: 0.1 - 2.1 keV (currently 0.1 - 1.9 keV) | Operational |
I10 - BLADE: Beamline for Advanced Dichroism Experiments | Soft X-ray resonant scattering, XAS and X-ray magnetic circular and linear dichroism | Circular: 400-1600eV; Linear Horizontal: 250-1600eV; Linear Vertical: 480-1600eV | Operational |
I11 - High Resolution Powder Diffraction | X-ray powder diffraction | 6 - 25(30) keV (0.5 - 2.1 Å) | Operational |
DIAD: Dual Imaging and Diffraction | Simultaneous imaging and diffraction | 8 - 38 keV | Construction |
I12 - JEEP: Joint Engineering, Environmental and Processing | Time-resolved imaging and tomography (phase- and attenuation-contrast), time-resolved powder diffraction, single crystal diffraction, diffuse scattering, energy dispersive X-ray diffraction (EDXD), high-energy small angle X-ray scattering (under development) | 53 - 150 keV monochromatic or continuous white beam | Operational |
I13 - X-ray Imaging and Coherence | Phase contrast imaging, tomography, full-field microscopy (under commissioning), coherent diffraction and imaging (CXRD, CDI), ptychography and photocorrelation spectroscopy (XPCS) (under commissioning), innovative microscopy and imaging | Imaging branch: 8 - 30 keV | Operational |
Coherence branch: 7 - 20 keV | |||
I14 - Hard X-ray Nanoprobe | Scanning X-ray fluorescence, X-ray spectroscopy, ptychography and transmission diffraction | 5 - 23 keV | Optimisation |
I15 - Extreme Conditions | Powder diffraction, single crystal diffraction | Monochromatic and focused 20 - 80 keV | Operational |
I15-1 - XPDF | X-ray Pair Distribution Function (XPDF) | 40, 65, and 76 keV | Operational |
I16 - Materials and Magnetism | Resonant and magnetic single crystal diffraction, fundamental X-ray physics | 2.5 - 15 keV | Operational |
B16 - Test beamline | Diffraction, imaging and tomography, topography, reflectometry | 4 - 20 keV monochromatic focused 4 - 45 keV monochromatic unfocused White beam | Operational |
I18 - Microfocus Spectroscopy | Micro XAS, micro Extended X-ray Absorption Fine Structure (EXAFS), micro fluorescence tomography, micro XRD | 2.05 - 20.5 keV | Operational |
B18 - Core XAS | X-ray Absorption Spectroscopy (XAS) | 2.05 - 35 keV | Operational |
I19 - Small-Molecule Single-Crystal Diffraction | Small-molecule single-crystal diffraction | 5 to 25 keV (0.5 to 2.5 Å) | Operational |
I20 - LOLA: Versatile X-ray Spectroscopy | X-ray Absorption Spectroscopy (XAS), X-ray Emission Spectroscopy (XES) and Energy Dispersive EXAFS (EDE) | Dispersive branch: 6 - 26 keV | Optimisation |
Scanning branch: 4 - 20 keV | Operational | ||
I21 - Inelastic X-ray Scattering | Resonant Inelastic X-ray Scattering (RIXS), X-ray Absorption Spectroscopy (XAS) | Currently 250 - 1500 eV (to be upgraded to 250 - 3000 eV) | Optimisation |
B21 - High Throughput SAXS | BioSAXS, solution state small angle X-ray scattering | 8 - 15 keV (set to 13.1 keV by default) | Operational |
I22 - Small Angle Scattering and Diffraction | Small angle X-ray scattering and diffraction: SAXS, WAXS, USAXS, GISAXS. Micro-focus. | 7 - 20 keV | Operational |
B22 - MIRIAM: Multimode InfraRed Imaging And Mircrospectroscopy | IR micro- & nano-spectroscopy, IR imaging, THz spectroscopy | nanoFTIR : 4000-900 cm-1 (2.5-11 μm) microFTIR: 10,000-100 cm-1 (1-100 μm) Spectroscopy (FTIR): 10,000-10 cm-1 (1-1000 μm) Imaging (FPA): 10,000-900 cm-1 (1-11 μm) | Operational |
I23 - Long Wavelength MX | Long wavelength macromolecular crystallography | 3 - 8 keV (1.5 - 4.1 Å) | Optimisation |
B23 - Circular Dichroism | Circular Dichroism (CD) | 125-500 nm & 165-650 nm for CD Imaging at 50 μm resolution, 96-cell High-Throughput CD (HTCD) and High-Pressure CD up to 200 MPa | Operational |
I24 - Microfocus and Serial MX | Macromolecular crystallography, MAD, Serial Crystallography | 6.5 - 25.0 keV | Operational |
B24 - Cryo Transmission X-ray Microscopy (TXM) | Full field X-ray imaging | 200 - 2600 eV | Optimisation |
Diamond Light Source is the UK's national synchrotron science facility, located at the Harwell Science and Innovation Campus in Oxfordshire.
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Harwell Science & Innovation Campus
Didcot
Oxfordshire
OX11 0DE
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