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The microfocus spectroscopy beamline, I18, uses 2 x 2 µm2 beam to examine heterogeneous materials on the micrometre scale using a variety of techniques, such as XRF, XANES and XRD.
The Scanning X-ray Microscopy (SXM) beamline (I08) is dedicated to morphological, elemental and chemical speciation on a broad range of organic-inorganic specimens in a 250-4400 eV photon energy range, and sample investigations under ambient or cryogenic conditions.
I14, the Hard X-ray Nanoprobe beamline, offers a small beam of 50 nm for high-resolution imaging with a wide energy range (5-23 keV). The beamline has developed and expanded its capabilities in X-ray fluorescence, diffraction and XANES mapping. Raster scanning capability combined with simple data acquisition software is suitable for fast acquisition and increased sample area coverage.
The core EXAFS beamline, B18, is characterised by a wide energy range, a focused beam and a continuous scanning monochromator. These characteristics allow for efficient collection of XAS data on all elements heavier than phosphorus.
The recent implementation of a fluorescence mapping tool has enabled new experiments to be performed on the beamline.
Download a pdf copy of our beamline sheets for more detailed information
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