Instrument Specifications

The specifications of the PEEM are meant as guidelines for ideal experimental conditions. These conditions can be summarized as: good sample conductivity, clean surface and atomically flat, high contrast and stability. The use of the cryostat or non-standard sample environments may affect the ultimate spatial resolution. Achievement of high-resolution requires a lot of effort and has to be discussed with the beamline staff.

The field of view can be changed between 80 and 2 micrometers. For XPEEM the largest field of view is 20 micrometers (limited by the size of the X-ray beam).

Fields of View

The fields of view may vary between 80 and 2 mm. For XPEEM and LEEM, the largest field of view is limited by the size of the illumination source of 10 mm (x-rays) and 50 mm (LEEM), respectively.

The UHV sample preparation chamber is currently in the installation phase. Please, contact a member of the beamline staff for further information.

One evaporation source is available in the main chamber and two in the preparation chamber. EFM 3 evaporators are currently fitted. For available evaporants and crucibles, please discuss your needs with the beamline staff. The access to the chambers is through a DN40 flange with an inner bore diameter is 38 mm. For the distances to the sample, please contact the beamline staff.

Evaporation of most metallic compounds is allowed (Au, Ag, Co, Cu, Fe, ...). Volatile elemtents are NOT allowed. Details must be discussed with beamline staff before experiment starts.

Dosing of gasses is possible and has to be agreed with the beamline staff well in advance of the experiment starting.

Evaporation of volatile organic molecules is not permitted in the PEEM or the PEEM Preparation Chamber.