The study of materials under high pressures and temperatures is a rapidly-expanding field, impacting on a diverse range of fields, including fundamental physics and chemistry, earth and planetary science, bio-molecular science, and research into novel materials.

Synchrotron diffraction experiments are fundamental to the study of material properties under extreme conditions. Intense, very high-energy X-rays from a 3rd generation source can penetrate into complex sample assemblies, and can be collimated to a few µm, permitting detailed mapping of structural order or disorder, chemical fingerprint, or single crystal structure determination.

The beamline provides monochromatic high-energy X-rays in both focused and unfocused mode up to 80 keV. Beam size conditions apply for high energies > 28 KeV. Minimum beam size > 28 keV is 80-100 microns.

The total flux (in units of photons/s/0.1%bw) can be calculated with the XOP software using the deflection parameter Kx=0 and Ky=5.604 B(T) and the design specifications for the wiggler

Available configuration for mono beam: