Extended X-ray Absorption Fine Structure (EXAFS) is a member of the XAS family. The incident energy is scanned in order to measure the absorption coefficient. EXAFS is elemental specific and is used to determine the oxidation state as well as the first neighbours of the absorbing atom.
µX-ray absorption spectroscopy, µX-ray fluorescence imaging and µdiffraction using high-brightness focused X-ray beam. Other techniques available include X-ray Excited Optical Luminescence (XEOL), X-ray Fluorescence Tomography, Fluorescence ReflEXAFS, Differential Phase Contrast Imaging.
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B18 is a general purpose EXAFS beamline. The Core-EXAFS is used for an extensive range of studies and applications, including local structure and electronic state of active components, and the study of materials including fluids, crystalline and non-crystalline (amorphous phases & colloids) solids, surfaces and biomaterials.
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I20 now covers two very distinctive modes of operation: X-ray Absorption Spectroscopy (XAS) on challenging samples, X-ray Emission Spectroscopy (XES). The beamline is equipped with a wiggler for the scanning branchline (I20-scanning). The Energy Dispersive branch has been closed.
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The Hard X-ray nanoprobe I14 beamline is a dedicated facility for nanoscale microscopy. The central theme of the beamline is the ability to obtain structural and chemically-specific information on a full range of materials (inorganic/organic) under both static and real (e.g. wet, heated, in-situ strain) conditions.
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