Diamond Annual Review 2025-26

Beamlines Beamline Main Capabilities Energy / Wavelength Range I15 - Extreme Conditions Powder diffraction, single crystal diffraction Monochromatic and focused 20 - 80 keV I15-1 - XPDF X-ray Pair Distribution Function (XPDF) 40, 65, and 76 keV I16 - Materials and Magnetism Resonant and magnetic single crystal diffraction, fundamental X-ray physics 2.57 - 15 keV B16 - Test beamline Diffraction, imaging and tomography, topography, reflectometry 4 - 20 keV monochromatic focused; 4 - 45 keV mono- chromatic unfocused White beam I18 - Microfocus Spectroscopy Microfocus X-ray Absorption Spectroscopy (XAS), X-ray fluorescence (XRF) and X-ray diffraction (XRD) mapping and tomography 2.05 - 20.5 keV B18 - Core XAS X-ray Absorption Spectroscopy (XAS) 2.05 - 35 keV I19 – Small Molecule Single Crystal Diffraction Small molecule single crystal diffraction 5 to 25 keV / 0.5 to 2.5 Å I20 - LOLA: Versatile X-ray Spectroscopy X-ray Absorption Spectroscopy (XAS), X-ray Emission Spectroscopy (XES) Scanning branch: 4.5 - 20 keV I21 - Inelastic X-ray Scattering Resonant Inelastic X-ray Scattering (RIXS), X-ray Absorption Spectroscopy (XAS) 250 - 3000 eV B21 - High Throughput SAXS BioSAXS, solution state small angle X-ray scattering 6 - 23 keV (set to 13.1 keV by default) I22 - Small Angle Scattering and Diffraction Small angle X-ray scattering and diffraction: SAXS, WAXS, USAXS, GISAXS. Micro-focus SAXS Tensor Tomography. Micro-focus capability. 7 - 20 keV P38 - labSAXS (Offline SAXS instrument SAXS/WAXS, GiSAXS/GiWAXS 9.2; 17.4 keV B22 - MIRIAM: Multimode InfraRed Imaging And Microspectroscopy FTIR microscopy & FPA imaging FTIR and THz spectroscopy FTIR nanospectroscopy s-SNOM and AFM IR microFTIR: 5,000-500cm1 (2-20μm) FTIR/THz:10,000-10cm1 (1-1000μm) nanoFTIR: 5000-600cm1 (2-17μm) I23 - LongWavelength MX Long wavelength macromolecular crystallography 2.1 - 11 keV (1.1 - 5.9 Å) B23 - Circular Dichroism Circular Dichroism (CD) Module A: 125-500nm for CD Imaging at 50 μm spatial resolution, and for 96-cell high throughput CD (HTCD). Module B: 180-700nm for MMP at 50 μm spatial resolution. I24 - Microfocus and Serial MX MX, MAD, Serial Crystallography, high energy MX 7 - 30.0 keV B24 - Cryo Transmission X-ray Microscopy (TXM) Cryo Structured Illumination microscope (CryoSIM) 3D cryo super resolution fluorescence microscopy /correlative microscopy 405, 488, 561, 647 nm New beamlines in development for Diamond-II Electron Microscopes Beamline Main Capabilities Energy / Wavelength Range K04 - ultra-HT MX for XChem Automated, integrated, ultra-high throughput crystal preparation and MX for accelerated chemical biology 10 – 27 keV K14 - SWIFT X-ray Absorption Spectroscopy (Quick-EXAFS), X-ray fluorescence (XRF) and X-ray diffraction (XRD) mapping and tomography 4-34 keV I17 – CSXID Ptychography, Tomography, Scanning Transmission X-ray Microscopy (STXM), X-ray Absorption Spectroscopy (XAS) and X-ray Magnetic Circular and Linear Dichroism (XMCD/XMLD) 250 eV – 2000 eV Microscope Main Capabilities Accelerating Voltages Titan Krios I Cryo-EM, Cryo-ET 80, 120, 200, 300 kV Titan Krios II Cryo-EM, Cryo-ET 80, 120, 200, 300 kV Titan Krios III Cryo-EM, Cryo-ET 80, 120, 200, 300 kV Titan Krios IV Cryo-EM, Cryo-ET 80, 120, 200, 300 kV Titan Krios V Cryo-EM, Cryo-ET 80, 120, 200, 300 kV Glacios Cryo-EM, Cryo-ET 200 kV Aquilos Cryo-SEM, Cryo-FIB 3 to 30 kV JEOL ARM200F Atomic scale STEM imaging, EELS, EDX, electron diffraction 80, 200 kV JEOL ARM300F Atomic scale TEM and STEM imaging, electron diffraction, 4D-STEM, EDX 30, 60, 80, 160, 200, 300 kV 45 46 Annual review 2025/26