Diamond Annual Review 2025-26

Macromolecular Crystallography Crystallography Structures and Surfaces Biological Cryo-Imaging Magnetic Materials Spectroscopy Imaging and Microscopy Soft Condensed Matter Optics and Metrology I14 I13 I13-2 Krios I XChem MPL eBIC ePSIC labSAXS Active Materials Laboratory (AML) Diamond House KEY I21 VMXi VMXm B24 I24 Optics and Metrology Laboratory B23 I23 B22 I22 B21 I20 B18 I19 I18 B16 CSXID I16 I15-1 I15 I03 I04-1 I04 K04 I05 I06 I07 B07 I08 I09 I10 I11 DIAD I12 Science groups around our facility Beamlines Beamline Main Capabilities Energy / Wavelength Range Versatile MX micro (VMXm) Micro- and nano-focus in vacuum cryo-macromolecular crystallography 7 - 28 keV Versatile MX in situ (VMXi) In situ microfocus, room temperature macromolecular crystallography, Serial Synchrotron Crystallography 10 - 25 keV I03 - UDC MX High Throughput (HT) Unattended Data Collection (UDC) Macromolecular Ccrystallography (MX), Multiwavelength Anomalous Diffraction (MAD) 5 - 25 keV I04 - Microfocus MX MX, MAD, variable and microfocus MX 6 - 2018 keV I04-1 - Monochromatic MX MX, XChem fragment screening 13.53 keV (fixed wavelength) I05 - ARPES Angle-Resolved PhotoEmission Spectroscopy (ARPES) and nano-ARPES 18 - 240 eV; 500 eV I06 - Nanoscience X-ray Absorption Spectroscopy (XAS), X-ray photoemission microscopy and X-ray magnetic circular and linear dichroism 80 eV – 2200 eV I07 - Surface and Interface Diffraction Surface X-ray diffraction (SXRD), Grazing Incidence X-ray Diffraction (GIXD), Grazing Incidence Small Angle X-ray Scattering (GISAXS), X-ray Reflectivity (XRR) 6 - 30 keV B07 - VerSoX: Versatile Soft X-ray Branch C: Ambient Pressure XPS and NEXAFS 110 - 2800 eV Branch B: NEXAFS and High-Throughput XPS 45 - 2200 eV I08 - Scanning X-ray Microscopy Scanning X-ray microscopy, NEXAFS/ XANES, X-ray fluorescence (XRF) I08 branch: 250 eV - 4.4 keV I08-1 - Soft and Tender X-ray Ptychography branch: 250 - 2000 eV I09 - Atomic and Electronic Structure of Surfaces and Interfaces XPS (including HAXPES), X-ray Standing Waves (XSW), Near Edge X-ray Absorption Fine Structure (NEXAFS), energy-scanned photoelectron diffraction Hard X-rays: 2.1 - 18+20 keV I10 - BLADE: Beamline for Advanced Dichroism Experiments Soft X-ray resonant scattering, XAS and X-ray magnetic circular and linear dichroism Circular: 400-1600 eV; Linear Horizontal: 250- 1600 eV; Linear Vertical: 480-1600 eV I11 - High Resolution Powder Diffraction X-ray powder diffraction 7 – 25 keV (1.7 - 0.5 - 2.1 Å) DIAD: Dual Imaging and Diffraction Correlated X-ray computed tomography (XCT) and microfocus X-ray powder diffraction (XRD) Imaging: 7 - 38 keV Diffraction: 7 - 38keV I12 - JEEP: Joint Engineering, Environmental and Processing Time-resolved imaging and tomography (EH1 and EH2); phase contrast imaging (EH1); 2D detector for time-resolved monochromatic powder diffraction, single crystal diffraction and diffuse scattering; energy dispersive X-ray diffraction (EDXD); 53 keV - 150 keV monochromatic or continuous white beam I13-1 - Coherence Nano-tomography: Ptychography, X-ray fluorescence (XRF), X-ray diffraction (XRD). 3D Bragg mapping: Coherent diffraction imaging (CDI) and Ptychography 6 – 20 KeV I13-2 X-ray imaging Phase contrast imaging, Tomography, Ptychography, Bragg CDI, Full-field microscopy (TXM), grating interferometry, nano-tomography 8 – 30 keV I14 - Hard X-ray Nanoprobe Nanofocus X-ray fluorescence (XRF), X-ray Absorption Spectroscopy (XAS) and transmission diffraction (XRD) mapping and tomography. Differential phase contrast (DPC) imaging, ptychography and ptycho-tomography. 5 - 23 keV 43 44 Annual review 2025/26