Diamond Annual Review 2021/22

12 13 D I A M O N D L I G H T S O U R C E A N N U A L R E V I E W 2 0 2 1 / 2 2 D I A M O N D L I G H T S O U R C E A N N U A L R E V I E W 2 0 2 1 / 2 2 Diamond’s beamlines: current operational status April 2022 Beamline Name and Number Main Techniques Energy / Wavelength Range Status I02-1 - Versatile MX micro (VMXm) Micro- and nano-focus in vacuum cryo-macromolecular crystallography (VMXm) 7 - 28 keV Optimisation I02-2 - Versatile MX in situ (VMXi) In situ microfocus macromolecular crystallography, Serial Synchrotron Crystallography 10 - 25 keV Optimisation I03 - MX Macromolecular crystallography (MX), Multiwavelength Anomalous Diffraction (MAD) 5 - 25 keV Operational I04 - Microfocus MX MX, MAD, variable and microfocus MX 6 - 18 keV Operational I04-1 - Monochromatic MX MX, XChem fragment screening 13.53 keV (fixed wavelength) Operational I05 - ARPES Angle-Resolved PhotoEmission Spectroscopy (ARPES) and nano-ARPES 18 - 240 eV; 500 eV Operational I06 - Nanoscience X-ray Absorption Spectroscopy (XAS), X-ray photoemission microscopy and X-ray magnetic circular and linear dichroism 80eV - 2200eV Operational I07 - Surface and Interface Diffraction Surface X-ray diffraction, Grazing Incidence X-ray Diffraction (GIXD), Grazing Incidence Small Angle X-ray Scattering (GISAXS), X-ray Reflectivity (XRR) 6 - 30 keV Operational B07 - VerSoX: Versatile Soft X-ray Branch C: Ambient Pressure XPS and NEXAFS 110 - 2800 eV Operational Branch B: NEXAFS and High-Throughput XPS 45 - 2200 eV Optimisation I08 - Scanning X-ray Microscopy Scanning X-ray microscopy, NEXAFS/ XANES, X-ray fluorescence I08 branch: 250 eV - 4.4 keV Operational I08-1 - Soft and Tender X-ray Ptychography branch: 250 - 2000 eV Optimisation I09 - Atomic and Electronic Structure of Surfaces and Interfaces XPS (including HAXPES), X-ray StandingWaves (XSW), Near Edge X-ray Absorption Fine Structure (NEXAFS), energy-scanned photoelectron diffraction Hard X-rays: 2.1 - 18+ keV Soft X-rays: 0.1 - 2.1 keV (currently 0.1 - 1.9 keV) Operational I10 - BLADE: Beamline for Advanced Dichroism Experiments Soft X-ray resonant scattering, XAS and X-ray magnetic circular and linear dichroism Circular: 400-1600eV; Linear Horizontal: 250- 1600eV; Linear Vertical: 480-1600eV Operational I11 - High Resolution Powder Diffraction X-ray powder diffraction 7 - 25keV (1.7 - 0.5 - 2.1 Å) Operational DIAD: Dual Imaging and Diffraction Simultaneous time-resolved X-ray imaging and X-ray powder diffraction 8 - 38 keV Optimisation I12 - JEEP: Joint Engineering, Environmental and Processing Time-resolved imaging and tomography; 2D detector for time-resolved powder diffraction, single crystal diffraction and diffuse scattering; energy dispersive X-ray diffraction (EDXD); high-energy small angle X-ray scattering (limited capability) 53 keV - 150 keV monochromatic or continuous white beam Operational I13 - X-ray Imaging and Coherence Phase contrast imaging, tomography, full-field microscopy (under commissioning), coherent diffraction and imaging (CXRD,CDI), ptychography and photocorrelation spectroscopy (XPCS) (under commissioning), innovative microscopy and imaging Imaging branch: 8 - 30keV Operational Coherence branch: 7 - 20keV I14 - Hard X-ray Nanoprobe Nanofocus X-ray fluorescence (XRF), X-ray absorption spectroscopy (XAS), and transmission diffraction (XRD) mapping., differential phase contrast (DPC) imaging,), ptychography and tomography 5 - 23 keV Operational I15 - Extreme Conditions Powder diffraction, single crystal diffraction Monochromatic and focused 20 - 80 keV White beam Operational I15-1 - XPDF X-ray Pair Distribution Function (XPDF) 40, 65, and 76 keV Operational I16 - Materials and Magnetism Resonant and magnetic single crystal diffraction, fundamental X-ray physics 2.5 - 15 keV Operational B16 - Test beamline Diffraction, imaging and tomography, topography, reflectometry 4 - 20 keV monochromatic focused 4 - 45 keV monochromatic unfocused White beam Operational I18 - Microfocus Spectroscopy Microfocus X-ray Absorption Spectroscopy (XAS), X-ray fluorescence (XRF) and X-ray diffraction (XRD) mapping and tomography 2.05 - 20.5 keV Operational B18 - Core XAS X-ray Absorption Spectroscopy (XAS) 2.05 - 35 keV Operational I19 - Small-Molecule Single- Crystal Diffraction Small-molecule single-crystal diffraction 5 to 25 keV / 0.5 to 2.5 Å Operational I20 - LOLA: Versatile X-ray Spectroscopy X-ray Absorption Spectroscopy (XAS), X-ray Emission Spectroscopy (XES) and Energy Dispersive EXAFS (EDE) Dispersive branch: 6 - 26 keV Operational Scanning branch: 4.5 - 20 keV Operational I21 - Inelastic X-ray Scattering Resonant Inelastic X-ray Scattering (RIXS), X-ray Absorption Spectroscopy (XAS) Currently 250 - 1500 eV (to be upgraded to 250 - 3000 eV) Operational B21 - High Throughput SAXS BioSAXS, solution state small angle X-ray scattering 8 - 15 keV (set to 13.1 keV by default) Operational I22 - Small Angle Scattering and Diffraction Small angle X-ray scattering and diffraction: SAXS,WAXS, USAXS, GISAXS. Micro- focus. 7 - 20 keV Operational B22 - MIRIAM: Multimode InfraRed Imaging And Mircrospectroscopy FTIR microscopy & FPA imaging FTIR and THz spectroscopy NEW FTIR nanospectroscopy s-SNOM and AFM IR microFTIR: 5,000-500cm 1 (2-20µm) FTIR/THz:10,000-10cm 1 (1-1000µm) nanoFTIR: 14000-800cm 1 (2.5-12.5µm) Operational (AFM IR commissioning) I23 - LongWavelength MX Long wavelength macromolecular crystallography 2.1 - 11 keV (1.1 - 5.9 Å) Operational B23 - Circular Dichroism Circular Dichroism (CD) Module A: 125-500nm for CD Imaging at 50 µm spatial resolution, and 96-cell HTCD. Module B: 180-650nm for MMP Imaging at 50 µm spatial resolution. Operational I24 - Microfocus and Serial MX MX, MAD, Serial Crystallography, high energy MX 7 - 30.0 keV Operational B24 - Cryo Transmission X-ray Microscopy (TXM) Full field X-ray imaging 200eV - 2600eV Operational Microscope Main Capabilities Accelerating Voltages Operational Status Titan Krios I Cryo-EM, Cryo-ET 80, 120, 200, 300 kV Operational Titan Krios II Cryo-EM, Cryo-ET 80, 120, 200, 300 kV Operational Titan Krios III Cryo-EM, Cryo-ET 80, 120, 200, 300 kV Operational Titan Krios IV Cryo-EM, Cryo-ET 80, 120, 200, 300 kV Operational Titan Krios V Cryo-EM, Cryo-ET 80, 120, 200, 300 kV Operational Talos Arctica Cryo-EM, Cryo-ET, MicroED 200 kV Operational Glacios Cryo-EM, Cryo-ET 200 kV Operational Glacios 2 Cryo-EM, Cryo-ET, MicroED 200 kV Operational Scios Cryo-SEM, Cryo-FIB 3 to 30 kV Operational Aquilos 2 Cryo-SEM, Cryo-FIB 3 to 30 kV Operational JEOL ARM200F Atomic scale STEM imaging, EELS, EDX, electron diffraction 80, 200 kV Operational JEOL ARM300F Atomic scale TEM and STEM imaging, electron diffraction, 4D-STEM, EDX 30, 60, 80, 160, 200, 300 kV Operational JEOL Ion Beam 4700F SEM, FIB 1 to 30 kV Operational Electron Microscopes Beamline Development and Technical Summary I n itsfifteenthyear of experiments, Diamond is nowoperatingwith33beamlines andeight electronmicroscopes dedicated for experiments. A further five instruments are available for experiment support and sample preparation. Ten of the instruments specialise in life sciences and make up eBIC (electron Bio-Imaging Centre), with two provided for industry use in partnership with Thermo Fisher Scientific. Two of the electron microscopes are dedicated to advanced materials research and are supplied by Johnson Matthey and the University of Oxford. These, alongwith a further instrument for sample preparation, formePSIC (electron Physical Science Imaging Centre) and are operated under strategic collaboration agreements to provide for substantial dedicated peer reviewed user access. Both eBIC and ePSIC are next to the Hard X-ray Nanoprobe beamline (I14). Along with eBIC and ePSIC, the UK X-ray Free Electron Laser (XFEL) Hub, the Membrane Protein Laboratory (MPL), the XChem fragrment screening facility and the Offline SAXS facility make up the complementary integrated facilities available at Diamond. For academic research, Diamond instruments (beamlines and microscopes) are free at the point of access through peer review. For proprietary research, access can be secured through Diamond’s industry team. The instruments and beamlines are organised into eight science groups as described below. Krios I Krios IV Krios V Glacios Aquilos ARM 200F ARM 300F Talos Arctica Scios Krios II Krios III Glacios2 Cryo- CLEM Ion Beam 4700F I04 Microfocus MX I05 ARPES: Angle-Resolved Photoemission Spectroscopy I06 Nanoscience I07 Surface and Interface Di raction B07 VerSoX: Versatile Soft X-ray I08 Scanning X-ray Microscopy I09 Atomic and Electronic Structure of Surfaces and Interfaces I10 BLADE: X-ray Dichroism and Scattering I11 High Resolution Powder Di raction & Long Duration Experiments (LDE) I12 JEEP: Joint Engineering, Environmental and Processing DIAD: Dual Imaging and Di raction I13 X-ray Imaging and Coherence Hard X-ray Nanoprobe I14 XPDF: X-ray Pair Distribution Function I15-1 Materials and Magnetism I16 B16 Microfocus Spectroscopy I18 Core XAS: X-ray Absorption Spectroscopy B18 Small-Molecule Single-Crystal Di raction I19 LOLA: Versatile X-ray Spectroscopy I20 Inelastic X-ray Scattering I21 High Throughput SAXS B21 Small Angle Scattering and Di raction I22 MIRIAM: Infrared Microspectroscopy B22 LongWavelength MX I23 Circular Dichroism B23 Microfocus and Serial MX I24 I02-2 VMXi: Versatile MX in situ I02-1 VMXm: Versatile MX micro Cryo-TXM: Cryo-Transmission X-ray Microscopy B24 Membrane Protein Laboratory I03 MX I04-1 MX Extreme Conditions I15 XChem facility for fragment-based screening UK X-ray Free Electron Laser (XFEL) Hub Electron Physical Science Imaging Centre (ePSIC) Electron Bio-Imaging Centre (eBIC) Test Beamline O ine SAXS Macromolecular Crystallography Soft Condensed Matter Biological Cryo-Imaging Spectroscopy Magnetic Materials Crystallography Imaging and Microscopy Structures and Surfaces