Diamond Annual Review 2023/24

37 D I A M O N D L I G H T S O U R C E A N N U A L R E V I E W 2 0 2 3 / 2 4 The new soft X-ray spectro- and tomo-ptychography branchline I08-1 (operating iin the 250-2000 eV photon energy range) is growing in capabilities and has been enthusiastically received by initial users with clear benefits for experiments for many experiments transitioning from I08 to I08-1. Key developments for I08-1, such as providing access to the carbon edge for ptychographic studies are well under way and key developments focus on multi-dimensional spectroscopic ptychographic imaging of light elements including variable polarisation of X-rays. I14 I14, the Hard X-ray Nanoprobe beamline, provides a focussed beam of 50 nm for high resolution imaging of a wide range of samples using multiple techniques including X-ray fluorescence, diffraction, X-ray Absorption Near Edge Structure (XANES), differential phase contrast imaging and ptychography. The beamline continues to improve the data processing workflows, providing live processing pipelines to enable fast visualisation of results. Recent developments have further optimised the tomography capabilities, frommaple mounting through to reconstruction tools, allowing easier three dimensional imaging of morphologies and elemental distributions. The beamline has a strong focus on in situ characterisation and provides environments for gas flow, heating, liquid and electrochemistry, while the flexible endstation space enables integration if customised user sample environments. ePSIC The electron Physical Science Imaging Centre (ePSIC) at Diamond consists of two transmission electron microscopes, a JEOL ARM 200 and a JEOL GRAND ARM 300, which were brought to Diamond through a collaboration with Johnson Matthey and the University of Oxford respectively. The ARM 200 is a state-of-the-art probe-corrected analytical microscope capable of X-ray spectroscopy and atomic resolution electron energy loss spectroscopy with a recently upgraded Gatan Continuum K3 spectrometer. The ARM 300 is a dedicated imaging instrument aligned across a wide range of accelerating voltages (30 - 300 keV) and is equipped with an Oxford Instruments X-Max 100 EDX detector. It is both probe- and imaging-corrected and has numerous detectors, including a small pixel array (512 x 512) fast direct electron detector for low voltage work and a large pixel array (4K x 4K) fast direct electron detector for high voltage imaging. These combined capabilities make this a unique resource for electron microscopy within the UK. With in situ sample holders, users at ePSIC can perform variable temperature measurements from 100 to 1600 K, apply electrical bias to samples during imaging and transfer samples anaerobically into the microscope. For TEM sample preparation ePSIC runs a JEOL 4700F focused ion beam microscope with in situ lift out and anaerobic transfer capability. The state-of-the-art instrumentation available at ePSIC attracts both established electron microscopists looking to develop new techniques, and scientists with limited previous electron microscopy experience interested in the atomic structure of their samples. The state of the art instruments have a range of diverse science applications, and the user community continues to growwith exciting new results