Principal Electron Microscopist
Tel: +44 (0)1235 777437
ePSIC is equipped with two aberration corrected microscopes for studying materials at the atomic scale. The JEOL ARM300F is a double-corrected microscope dedicated to atomic scale imaging and 4D STEM studies. The JEOL ARM200F is a probe-corrected microscope that specializes in spectroscopic imaging with both EELS and EDX spectrometers.
The following capabilities are shared across both microscopes:
Phase Focus Limited of Sheffield, UK has an international portfolio of patents and pending applications which relate to ptychography. A current list is available at . Diamond light source has a licence with Phase Focus which covers ptychographic experiments performed at ePSIC. For more information please contact a member of ePSIC staff.
Diamond Light Source is the UK's national synchrotron science facility, located at the Harwell Science and Innovation Campus in Oxfordshire.
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