I08-SXM - The Diamond Scanning X-ray Microscopy Beamline

Scanning X-ray microscopes find applications in all major research fields, in many cases approaching ultimate diffraction-limited lateral resolutions and with unprecedented performance limited in the past by X-ray source properties, optics and detectors schemes. Missing in the general portfolio of scanning X-ray microscopes worldwide, and addressed by I08-SXM is an instrument that covers a broader photon energy range providing access to all major K- and L-absorption edges for SXM elemental and chemical analysis, combined with complementary imaging and spectroscopic techniques.

The central theme of the beamline is the ability to obtain morphological and chemically-specific information on a full range of materials (inorganic/organic), providing a facility that is new not only to the UK. I08 uses X-ray light in the 250 to 4400 eV photon energy range, generated by an Apple II type insertion device or undulator. This X-ray source is optimised  to enable studies exploiting linearly or circularly polarised radiation. The operating energy range encompasses a significant number of important K and L absorption edges for low- and medium-Z elements, and relatively thin samples (comparable to transmission electron microscopy) are able to be studied with both absorption and phase contrast techniques, with lateral resolutions down to ~50 nm depending on the imaging mode in daily user operation.

I08-SXM is operational and welcomes user by the standard DLS peer review process of proposal applications as well as by the rapid access route.

The instrument became recently complemented by an I08-1 branchline and end station for soft X-ray ptychography.