I24, the tuneable microfocus MX beamline, has recently completed its endstation upgrade with new sample viewing, increased stability and a novel dual goniometer design. The vertical goniometer provides a platform for standard pin-based experiments, while the horizontal goniometer is dedicated to in situ crystallography.
Dr Neil Paterson, PDRA on I24 with the horizontal goniometer.
For in situ crystallography a simple magnetic mount allows rapid exchange of trays. Automated change between the two modes is straightforward and can be done within a couple of minutes allowing mixed data collections within a single shift. The vertical goniometer offers a small sphere of confusion (less than 800 nm) and accurate sample positioning. A modular kappa mount can be used if required with almost no impact on the sphere of confusion. A concomitant upgrade of motor control hardware allows fast coordinated motions of multiple axes for high-speed grid and line scans.
Improved sample visualisation is an integral part of the upgraded endstation, achieved with a custom on-axis viewing system (OAV). The OAV offers both high-resolution sample visualisation at high zoom and a wide field of view at low zoom.
For more information or to discuss possible applications for your research, contact I24’s Principal Beamline Scientist, Dr Robin Owen: email@example.com.
The horizontal goniometer (left) and vertical goniometer (right).
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