Titan Krios I, II, III and IV are state of the art 300 KeV cryo-electron microcopes from FEI. They are equipped with the latest generation of direct electron detectors, the FEI Falcon III (Krios II-III) and the Gatan Bio-quantum K2 summit (Krios I-IV). Both detectors are integrated into FEI's automated data aquisition software for single particle and tomography, EPU and TOMO4 respectively.
The Talos Arctica is FEI’s new generation fully automated 200 kV FEG electron microscope. It is equipped with an autoloader system that permits loading of up to twelve specimens, automated data collection at liquid nitrogen temperature, and features a Constant-PowerTM objective lens for optimal contrast/resolution balance.
The Scios is a state-of-the-art DualBeam™ Scan Electron Microscopy (SEM) and Focused Ion Beam (FIB) system that allows for precision milling of samples. Technological advanced have increased throughput and milling precision, yielding higher quality results in less time, making it an ideal system for thinning of samples for subsequent TEM imaging.