Provide expert guidance in the design, build and commissioning phases of various X-ray beamline equipment such as micro and nano positioning stages, goniometers and metrology feedback systems for high precision motion devices. Conduct scientific research on how to mitigate the current limiting factors of nano-metrology through reduction of noise levels and long term drift of high precision instruments. Characterisation of parasitic error motions and optimisation of translation and rotation stages used for micro and nano positioning. Testing, characterisation and optimisation of high precision metrology instruments such as laser interferometers and capacitive displacement sensors. Factory acceptance testing of high precision motion devices and assemblies for X-ray beamlines.