The JEOL ARM300CF is an Atomic Resolution Electron Microscope, with both STEM and TEM Cs correctors providing a STEM-HAADF resolution of 47 pm and a TEM resolution of 50pm.
It is optimised for imaging over arrange of accelerating voltages from 60 – 300kV and is fitted with a range of detectors for different imaging modes. Heating a cooling specimen holders are available.
The JEOLARM300CF provides simultaneous STEM-ABF imaging for visualising light elements together with STEM-HAADF imaging using one of several detectors together with TEM imaging using either a direct electron detector or a fast coupled CMOS camera.
|STEM ADF Mode||47 pm (at 300kV, with cold FEG)|
|50 pm (at 300kV)|
|STEM||x 200 to x 250,000,000|
|TEM||x 50 to x 4,000,000|
|Emitter||W cold field|
|Accelerating voltage||300, 200, 100, 80 and 60kV|
|Stage||Eucentric Side Entry Goniometer stage |
Piezo X,Y,Z control
|Specimen size||3 mm|
|Maximum tilt angle||X axis: ±25° |
Y axis: ±25°
|Travel Range (mm)||X,Y: ±1, Z:±0.1|
|Probe forming system Cs-corrector||Yes (ETA Type)|
|Image forming system Cs-corrector||Yes (ETA Type)|
|Additional Options||Gatan one view Digital Camera |
Multiple STEM detectors
High resolution Direct detection TEM Camera
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