The JEOL ARM200CF is an Atomic Resolution Analytical Electron Microscope, with a STEM Cs corrector providing a STEM-HAADF resolution of 78 pm and full analytical capabilities using EDX and EELS. The Cs corrected electron probe has an increased current density, one order larger than conventional FE TEMs enabling elemental analysis at the atomic-level.
The JEOL ARM200CF provides simultaneous STEM-ABF imaging for visualising light elements together with STEM-HAADF imaging.
Elemental EDX analysis and elemental mapping at atomic resolution is provided using twin JEOL Centurio wide area (100 mm2) Silicon Drift Detector (SDD) for high-speed and high-sensitivity detection.
The narrow energy spread that is characteristic of the cold FEG enables high energy resolution EELS analysis and fast EELS mapping with dual EELS capability.
|78 pm (at 200kV, with cold FEG)|
|190 pm (at 200kV) |
|STEM||x 200 to x 150,000,000|
|TEM||x 50 to x 2,000,000|
|Emitter||W cold field|
|Accelerating voltage||200 to 80kV|
Eucentric Side Entry Goniometer stage
Piezo X, Y, Z control
|Specimen size||3 mm|
|Maximum tilt angle||X axis: ±25° |
Y axis: ±25°
|Travel Range (mm)|| X,Y: ±1, Z:±0.1 |
|Probe forming system |
|Image forming system |
|Additional Options||Double EDS 100mm2 high solid angle detectors |
Gatan Model 965 GIF Quantum ER
Gatan one view Digital Camera
Gatan Orius SC200D Digital Camera
TEM/STEM Tomography acquisition Module
Model 912 Tomography Holder
Gatan 914 Cryo-Tomography holder
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