Scattering of coherent x-rays has developed over the past years to a powerful lensless microscopy technique. I will start this presentation with a short overview about key properties of these techniques to discuss why there is still room for yet another X-ray microscopy technique. Briefly, key properties are the potential of wavelength limited spatial resolution (for x-rays on the order of 1 nm or better), experimental simplicity and the spacious sample environment. This introduction will be followed by a presentation of current break-through developments and then discuss in more detail how we have applied lensless microscopy for the investigation of magnetization phenomena occurring in thin films.
Today's high-brightness insertion device beam lines sufficiently fulfill the techniques' need of coherent x-rays. Benefiting from source coherence, on the other hand, makes these techniques ideally suited for X-ray Free Electron Lasers (X-FEL). Exploiting the high peak brightness of these sources lensless microscopy has the potential of femtosecond temporal and nanometer spatial snapshot microscopy. Capturing, for the first time, not only repetitive but also non-deterministic dynamics occurring on milli- to femtosecond time and sub micron length scales. A brief outlook of how this may be applied for the investigation of magnetization dynamics will conclude my presentation.
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