Most x-ray scattering experiments measure spatially-averaged properties of the sample, i.e. averaged over the volume of scattering. As such, Soft X-ray Resonant Magnetic Scattering (SXRMS) has become a very useful technique to explore the mean magnetic configuration of magnetic nanostructures. By using SXRMS with a coherent x-ray beam and measuring the scattered intensity with sufficient sampling, one is able to observe the fine details of the magnetic structure. The technique is very useful to study slow dynamics and magnetic memory at the submicron scale in patterned nanostructures and domain structures. It also opens the way towards magnetic imaging.
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