Science | Index

Surfaces and Interfaces
I05: Arpes Moritz Hoesche
I06: Nanoscience Sarnjeet Dhesi
Stuart Cavill
I07: Surface and Interface Diffraction Chris Nicklin
Tom Arnold
Jonathan Rawle
I09: SISA: Surface and Interface Structural Analysis Tien-Lin Lee
Federica Venturini

I10: BLADE: BeamLine for Advanced Dichroism Experiments

Paul Steadman
Peter Bencok
   
Engineering and Environmental Science
I11: Powder Diffraction Chiu Tang
Stephen Thompson
Julia Parker
I12: Joint Engineering and Processing Michael Drakopoulos
Thomas Connolley
Christina Reinhard
Leigh Connor
Robert Atwood
I15: Extreme Conditions Andrew Jephcoat
Heribert Wilhelm
Annette Kleppe
Nicola Casati
   
Materials
I13L: X-ray microscopic imaging with branchline for coherence Christoph Rau
Ulrich Wagner
I16: Materials and Magnetism Steve Collins
Alessandro Bombardi
Gareth Nisbet
B16: Test Beamline Kawal Sawhney
Igor Dolbnya
Manoj Tiwari
I19: Single Crystal Diffraction Dave Allan
Harriott Nowell
Sarah Barnett
   
Spectroscopy  
B18: Core EXAFS Andy Dent
Gianantonnio Cibin
Silvia Ramos
I18: Microfocus Spectroscopy Fred Mosselmans
Paul Quinn
Josep Roque-Rosell
Katolina Geraki
I20: XAS

Sofia Diaz-Moreno
Shu Hayama
Monica Amboage
Adam Freeman

   
Macromolecular Crystallography (MX)
MX: Ralf Flaig
David Hall
Katherine McAuley
Thomas Sorensen
Mike Latchem
James Sandy
Mark Williams
I04-1: Fixed wavelength MX station Jose Brandao-Neto
Alice Douangamath
I24 Microfocus MX: Gwyndaf Evans
David Waterman
Wes Armour
I23: Long Wavelength MX Armin Wagner
   
Soft Condensed Matter
B21: High Throughput SAXS Nick Terrill
Katsuaki Inoue
I22: Non-Crystalline Diffraction Nick Terrill
Marc Malfois
Jen Hiller
Claire Pizzey
B22: Infrared Microspectroscopy Gianfelice Cinque
Mark Frogley
B23: Circular Dichroism Giuliano Siligardi
Rohanah Hussain
Tamas Javorfi
Daniel Myatt