I07-Surface and Interface Diffraction

A high-resolution X-ray diffraction beamline for investigating the structure of surfaces and interfaces under different environmental conditions, including, for example, semiconductors and biological films.

Principal Beamline Scientist:
Dr Chris Nicklin
Tel: +44 (0)1235 778523

Beamline Scientist:
Dr Tom Arnold
Tel: +44 (0)1235 778543

Support Scientist:
Dr Jonathan Rawle
Tel: +44 (0)1235 778675

Status: Operational

Enter the Beamline I07 web area