Beamlines | X-ray Diffraction Imaging

Coherent X-ray diffraction is an imaging technique which overcomes some of the limitations encountered with using lenses. Instead, a series of X-ray diffraction patterns are combined to mathematically reconstruct a three dimensional image of the structure being studied. With highly coherent synchrotron X-rays, this approach can provide spatial resolution on a nm scale. In the past this technique has been applied to model repeating crystal structures, but it is now being used to examine small, non-periodic samples.

Benefits of Synchrotron Techniques

At present this technique can only be carried out using synchrotron X-rays, as no other source is capable of producing such coherent X-ray beams. The high penetration depth that is possible with synchrotron X-rays allows the study of bulk dynamics so that a full three-dimensional analysis is possible without destroying the sample.

Applications

Understanding the structure of polycrystalline materials allows information to be derived about their physical, chemical and electronic properties. This is vital in a wide range of fields, including the development of novel materials for engineering applications, in understanding environmental processes such as the transport of pollutants through different environments, and in drug design.

Beamlines

I06 - Nanoscience
I09 - SISA
I13L - X-ray microscopic imaging with branchline for coherence