Each beamline at Diamond is optimised for a specific technique. Read more about the various techniques here. You can also search our research expertise pages to find an expert who can advise on which beamlines are appropriate for your area of research.
Beamlines by technique
| Beamline Name and Number | Main Techniques | Energy / wavelength range | Status |
|---|---|---|---|
| I02 - Macromolecular Crystallography | Macromolecular Crystallography, MAD | 5 - 25 keV | Operational |
| I03 - Macromolecular Crystallography | Macromolecular Crystallography, MAD | 5 - 25 keV | Operational |
| I04 - Macromolecular Crystallography | Macromolecular Crystallography, MAD | 5 - 25 keV | Operational |
| I04-1 - Monochromatic MX | Macromolecular Crystallography | 13.53 keV (0.9163 Å – fixed wavelength) | Operational |
| I05 - ARPES | Angle-Resolved PhotoEmission Spectroscopy (ARPES) | 18 - 240 eV | Under construction |
| I06 - Nanoscience | X-ray absorption spectroscopy, X-ray photoemission microscopy and X-Ray Magnetic Circular and Linear Dichroism |
| Operational |
| I07 - Surface and Interface Diffraction | Surface X-ray diffraction, Grazing Incidence X-ray Diffraction (GIXD), Graxing Incidence Small Angle X-ray Scattering (GISAXS), X-ray Reflectivity (XRR) | 6 - 25 (30) keV | Operational |
| I08 - Soft X-ray Microscopy | X-ray scanning microscopy | 250 eV - 4 keV | In design phase |
| I09 - Surface and Interface Structural Analysis | Photoelectron Spectroscopy, X-ray Standing Waves, X-ray Absorption Spectroscopy, X-ray Photoelectron Diffraction, X-ray Reflectivity | Hard X-rays: 2.1 keV - 20 keV+ | Completion date: Oct 2012 |
| I10 - Beamline for Advanced Dichroism Experiments (BLADE) | soft x-ray resonant scattering, x-ray absorption spectroscopy and x-ray magnetic circular and linear dichroism | 400 - 2000 eV | Operational in optimisation mode |
| I11 - High resolution powder diffraction | X-ray powder diffraction | 5-30 keV (0.4-2.5 Å) | Operational |
| I12 - JEEP: Joint Engineering, Environmental and Processing | Imaging and tomography, X-ray diffraction, Small Angle X-ray Scattering (SAXS), Single Crystal Diffraction, Powder diffraction | 50 - 150 keV | Operational in optimisation mode |
| I13L - X-Ray Imaging and Coherence | Phase contrast imaging, Tomography | Imaging branch: 8 - 35 keV | First Users: Oct 2011 |
| I14 - A Hard X-ray Nanoprobe for Complex Systems | Scanning X-ray Fluorescence, X-ray spectroscopy and diffraction, small and wide angle X-ray scanning | 3.5 - 30 keV | In design phase |
| I15 - Extreme Conditions | Powder diffraction, single crystal diffraction | 20 - 70 keV mono mode. Beam size conditions apply for high energies > 30 KeV. 20 - 50 µm pinholes available. | Operational |
| I15-1 | X-ray Pair Distribution | Approved | |
| I16 - Materials and Magnetism | Diffraction/Scattering, Spectroscopy | 3.5 - 25 keV | Operational |
| B16 - Test Beamline | Diffraction, imaging, reflectometry |
| Operational |
| I18 - Microfocus Spectroscopy | X-ray absorption spectroscopy (XAS), Extended X-ray Absorption Fine Structure (EXAFS), Fluorescence tomography | 2 - 20 keV | Operational |
| B18 - Core EXAFS | XAS | 2.05 – 35 keV | Operational in optimisation mode |
| I19 - Small molecule single crystal diffraction | Small Molecule Single Crystal Diffraction | 5 to 25 keV / 0.5 to 2.5 Å | Operational |
| I20 - LOLA: X-ray spectroscopy | X-ray Absorption Spectroscopy (XAS), Energy Dispersive EXAFS (EDE), X-ray Emission Spectroscopy |
| Commissioning |
| B21 - High throughput SAXS | Small Angle X-ray Scattering & Diffraction | 6 - 23 keV | Under construction |
| I21 - Inelastic X-ray Scattering (IXS) | Inelastic X-ray Scattering | Approved | |
| I22 - Non-crystalline diffraction | Non-Crystalline diffraction: SAXS, WAXS, ASAXS, USAXS | 3.7 - 20 keV | Operational |
| B22 - MIRIAM: Multiband InfraRed Imaging And Microscopy | Infrared Microspectroscopy | 1.2 eV - 2.4 meV | Operational in optimisation mode |
| I23 - Long Wavelength MX | Long wavelength MX | 1 - 4 Å but optimised for 1.5 and 3.1 Å | Under construction |
| B23 - Circular dichroism | Circular Dichroism |
| Operational |
| B24 - Cryo-TXM | Full field X-ray imaging | Up to 2.5keV | In design phase |
| I24 - Microfocus MX | Macromolecular Crystallography, MAD | 6.5 - 25.0 keV | Operational |
| Location TBA | Spectroscopic and scanned-probe imaging | 50 - 2000 eV | Approved |