Each beamline at Diamond is optimised for a specific technique. Read more about the various techniques here. You can also search our research expertise pages to find an expert who can advise on which beamlines are appropriate for your area of research.
Beamlines by technique
| Beamline Name and Number | Main Techniques | Energy / wavelength range | Status |
|---|---|---|---|
| I02 - Macromolecular Crystallography | Macromolecular Crystallography, MAD | 5 - 25 keV | Operational |
| I03 - Macromolecular Crystallography | Macromolecular Crystallography, MAD | 5 - 25 keV | Operational |
| I04 - Macromolecular Crystallography | Macromolecular Crystallography, MAD | 5 - 25 keV | Operational |
| I04-1 - Monochromatic MX | Macromolecular Crystallography | 13.53 keV (0.9163 Å – fixed wavelength) | Completion date: Dec 09 |
| I06 - Nanoscience | X-ray absorption spectroscopy, X-ray photoemission microscopy and X-Ray Magnetic Circular and Linear Dichroism |
| Operational |
| I07 - Surface and Interface Diffraction | Surface X-ray diffraction, Grazing Incidence X-ray Diffraction (GIXD), Graxing Incidence Small Angle X-ray Scattering (GISAXS), X-ray Reflectivity (XRR) | 6 - 25 (30) keV | Operational in optimisation mode |
| I09 - Surface and Interface Structural Analysis | Completion date: Oct 2012 | ||
| I10 - Beamline for Advanced Dichroism Experiments (BLADE) | Completion date: Dec 2010 | ||
| I11 - High resolution powder diffraction | X-ray powder diffraction | 5-30 keV (0.4-2.5 Å) | Operational |
| I12 - JEEP: Joint Engineering, Environmental and Processing | Imaging and tomography, X-ray diffraction, Small Angle X-ray Scattering (SAXS), Single Crystal Diffraction, Powder diffraction | 50 - 150 keV | Completion date: Dec 09 |
| I13L - X-Ray Imaging and Coherence | Phase contrast imaging, Tomography | First Users: Oct 2011 | |
| I15 - Extreme Conditions | Powder diffraction, single crystal diffraction | 20 - 70 keV mono mode. Beam size conditions apply for high energies > 30 KeV. Minimum beam size >30 keV is 80-100 microns. | Operational |
| I16 - Materials and Magnetism | Diffraction/Scattering, Spectroscopy | 3.5 - 25 keV | Operational |
| B16 - Test Beamline | Diffraction, imaging, reflectometry |
| Operational |
| I18 - Microfocus Spectroscopy | X-ray absorption spectroscopy (XAS), Extended X-ray Absorption Fine Structure (EXAFS), Fluorescence tomography | 2 - 20 keV | Operational |
| B18 - Core EXAFS | XAS | 2.05 – 35 keV | First Users: Apr 2010 |
| I19 - Small molecule single crystal diffraction | Small Molecule Single Crystal Diffraction | 5 to 25 keV / 0.5 to 2.5 Å | Operational |
| I20 - LOLA: X-ray spectroscopy | X-ray Absorption Spectroscopy (XAS), Energy Dispersive EXAFS (EDE), X-ray Emission Spectroscopy |
| Completion date: February 2010 |
| I22 - Non-crystalline diffraction | Non-Crystalline diffraction: SAXS, WAXS, ASAXS, USAXS | 3.7 - 20 keV | Operational |
| B22 - Infrared Microspectroscopy | Infrared Microspectroscopy | 1.2 eV - 2.4 meV | First Users: Dec 2009 |
| B23 - Circular dichroism | Circular Dichroism |
| Operational |
| I24 - Microfocus MX | Macromolecular Crystallography, MAD | 6.5 - 25.0 keV | Operational |