Village: Surfaces and Interfaces
Current Research Techniques:
Surface X-ray diffraction
Grazing Incidence X-ray Diffraction (GIXD)
Grazing Incidence Small Angle X-ray Scattering (GISAXS)
X-ray Reflectivity (XRR)
|Insertion device||Cryo-cooled undulator*|
|Nominal magnet length (m)||2 m|
|Magnet period (mm)||17.7 mm|
|Source divergence (thoretical)||24.2 µrad (h) x 4.2 µrad (v)|
|Source size (thoretical)||122.9 µm (h) x 6.4 µm (v)|
* The cryo-cooled undulator was installed during the summer 2010 shutdown and is now operational (not yet achieved the minimum gap). This has resulted in a gain of flux at high energy of a factor of ~3-4. Before this date a U23 undulator, capable of energies up to 20 keV, was in place. Below is a comparison of the flux from these two undulators.
Kirkpatrick Baez focusing mirrors (Bimorph technology): capable of achieving a beam size of 115(v) x 210(h) μm FWHM at the sample position.
The mirrors are also for Harmonic Rejection: The contribution from harmonics is <10-4 at all energies.
Image of the focussed beam at the sample position:
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