Jonathan Rawle


Jonathan Rawle is a Senior Support Scientist working on beamline I07. Jonathan joined Diamond in 2006 after completing his PhD at the University of Leicester.

Tel: +44 (0) 1235 778675

Key Research Area

Key Research

Surface x-ray diffraction; study of self-assembled InAs/GaAs quantum dots

Research Expertise

  1. Research Expertise
  2. Publications
Research Expertise -

Current Research Interests

Self-assembled, buried quantum dots (QDs) exhibit unusual optical and electronic properties and have many applications in electronics and communications. The exact shape and composition of QDs strongly influences these properties. While some characteristics can be determined using STM, studying the buried quantum dots in-situ requires the use of a hard x-ray beamline in order to penetrate the capping layer.

Currently I am attempting to put together a research programme that will apply my expertise in surface x-ray diffraction to both to further quantum dot systems, and to other systems at semiconductor and metal interfaces.

I am involved in a number of other research projects on the beamline, both in-house and in collaboration with users. Examples include studies of: topological insulators, including in-situ growth; the structure of anatase on TiO2(100); the grain boundary interface of a silicon bicrystal; grazing incidence measurements of thin films used in solar cells.

Other duties include local contact support for a wide range of user experiments on the beamline, in particular those involving x-ray diffraction, or grazing incidence wide- and small-angle scattering, and everything from electrochemistry to coherent imaging of nanoparticles. I am also the beamline's resident computing guru and aid users in data extraction, reduction and analysis, both during and after their beamtime.

Publications - +

Selected Publications

  • Howes, PB; Rhead, S; Roy, M; Nicklin, CL; Rawle, JL; Norris, CA. Silicon Sigma 13(501) grain boundary interface structure determined by bicrystal Bragg rod X-ray scattering. Acta Materialia 61 5694-5701, September 2013.
  • dos Reis, DD; Barreto, L; Bianchi, M; Ribeiro, GAS; Soares, EA; Silva, WSE; de Carvalho, VE; Rawle, J et al. Surface structure of Bi2Se3(111) determined by low-energy electron diffraction and surface x-ray diffraction. Physical Review B 88 041404, July 2013.
  • Arnold, T; Nicklin, C; Rawle, J; Sutter, J; Bates, T; Nutter, B; McIntyre, G; Burt, M. Implementation of a beam deflection system for studies of liquid interfaces on beamline I07 at Diamond. Journal of Synchrotron Radiation 19 408-416, May 2012.
  • Agostinelli, T; Lilliu, S; Labram, JG; Campoy-Quiles, M ; Hampton, M; Pires, E; Rawle, J. et al. Real-Time Investigation of Crystallization and Phase-Segregation Dynamics in P3HT:PCBM Solar Cells During Thermal Annealing. Advanced Functional Materials 21 1701-1708, May 2011.
  • Rawle, JL; Howes, PB. Modelling x-ray scattering from quantum dots using Keating energy-minimised structures. European Physical Journal - Special Topics 167 47-52, February 2009.